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Journals in DBLP

IEEE Design & Test of Computers
2005, volume: 22, number: 1

  1. Rajesh K. Gupta
    Global competitiveness, outsourcing, and education in the semiconductor industry. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:5-6 [Journal]
  2. Kenneth D. Wagner
    Keeping current with silicon and systems technology in the mid-90s. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:7-9 [Journal]
  3. Stephen H. Unger
    Is engineering a viable profession in the US? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:10-11 [Journal]
  4. T. J. Rodgers
    The truth about outsourcing. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:12-13 [Journal]
  5. Alberto L. Sangiovanni-Vincentelli
    The importance of innovation in the economy of advanced countries. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:14-16 [Journal]
  6. R. Chandramouli
    Infrastructure IP design for repair in nanometer technologies. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:17- [Journal]
  7. Tiehan Lv, Jiang Xu, Wayne Wolf, Burak Ozer, Jörg Henkel, Srimat T. Chakradhar
    A Methodology for Architectural Design of Multimedia Multiprocessor SoCs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:18-26 [Journal]
  8. Alberto La Rosa, Luciano Lavagno, Claudio Passerone
    Software Development for High-Performance, Reconfigurable, Embedded Multimedia Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:28-38 [Journal]
  9. Brian Delaney, Tajana Simunic, Nikil Jayant
    Energy-Aware Distributed Speech Recognition for Wireless Mobile Devices. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:39-49 [Journal]
  10. Gustavo Neuberger, Fernanda Gusmão de Lima Kastensmidt, Ricardo Reis
    An Automatic Technique for Optimizing Reed-Solomon Codes to Improve Fault Tolerance in Memories. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:50-58 [Journal]
  11. Daniele Rossi, André K. Nieuwland, Atul Katoch, Cecilia Metra
    Exploiting ECC Redundancy to Minimize Crosstalk Impact. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:59-70 [Journal]
  12. Victor Berman
    Is it time to reexamine patent policy for standards? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:71-73 [Journal]
  13. Sachin S. Sapatnekar
    An EDA compendium. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:74-75 [Journal]

  14. Conference Reports. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:76-78 [Journal]

  15. DATC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:79- [Journal]
  16. Scott Davidson
    Testing: It's not just pass/fail anymore. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:1, pp:80- [Journal]
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