Rajesh K. Gupta The other face of design for manufacturability. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2005, v:22, n:3, pp:193- [Journal]
Alfred K. Wong Some Thoughts on the IC Design-Manufacture Interface. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2005, v:22, n:3, pp:206-213 [Journal]
Robert Madge New test paradigms for yield and manufacturability. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2005, v:22, n:3, pp:240-246 [Journal]
Robert Baumann Soft Errors in Advanced Computer Systems. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2005, v:22, n:3, pp:258-266 [Journal]
The Future Depends on Innovation: An Interview with Irwin M. Jacobs, cofounder, chairman, and CEO of Qualcomm. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2005, v:22, n:3, pp:268-279 [Journal]
Thomas W. Williams TTTC recognizes test visionary's lifetime contribution. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2005, v:22, n:3, pp:282- [Journal]
Victor Berman IEEE P1647 and P1800: Two approaches to standardization and language design. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2005, v:22, n:3, pp:283-285 [Journal]
Design Automation Technical Committee Newsletter. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2005, v:22, n:3, pp:286- [Journal]
Gary Smith Design for manufacturability comes of age. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2005, v:22, n:3, pp:288- [Journal]
NOTICE1
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The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP