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Journals in DBLP

IEEE Design & Test of Computers
2005, volume: 22, number: 3

  1. Rajesh K. Gupta
    The other face of design for manufacturability. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:193- [Journal]
  2. Andrew B. Kahng, Grant Martin
    DAC Highlights. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:197-199 [Journal]
  3. Juan Antonio Carballo, Yervant Zorian, Raul Camposano, Andrzej J. Strojwas, John Kibarian, Dennis Wassung, Alex Alexanian, Steve Wigley, Neil Kelly
    Guest Editors' Introduction: DFM Drives Changes in Design Flow. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:200-205 [Journal]
  4. Alfred K. Wong
    Some Thoughts on the IC Design-Manufacture Interface. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:206-213 [Journal]
  5. Jeng-Liang Tsai, Dong Hyun Baik, Charlie Chung-Ping Chen, Kewal K. Saluja
    Yield-Driven, False-Path-Aware Clock Skew Scheduling. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:214-222 [Journal]
  6. Jay Jahangiri, David Abercrombie
    Value-Added Defect Testing Techniques. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:224-231 [Journal]
  7. Greg Yeric, Ethan Cohen, John Garcia, Kurt Davis, Esam Salem, Gary Green
    Infrastructure for Successful BEOL Yield Ramp, Transfer to Manufacturing, and DFM Characterization at 65 nm and Below. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:232-239 [Journal]
  8. Robert Madge
    New test paradigms for yield and manufacturability. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:240-246 [Journal]
  9. Maher N. Mneimneh, Karem A. Sakallah
    Principles of Sequential-Equivalence Verification. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:248-257 [Journal]
  10. Robert Baumann
    Soft Errors in Advanced Computer Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:258-266 [Journal]

  11. The Future Depends on Innovation: An Interview with Irwin M. Jacobs, cofounder, chairman, and CEO of Qualcomm. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:268-279 [Journal]
  12. Sachin S. Sapatnekar
    Empowering the designer. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:280-281 [Journal]
  13. Thomas W. Williams
    TTTC recognizes test visionary's lifetime contribution. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:282- [Journal]
  14. Victor Berman
    IEEE P1647 and P1800: Two approaches to standardization and language design. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:283-285 [Journal]

  15. Design Automation Technical Committee Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:286- [Journal]
  16. Gary Smith
    Design for manufacturability comes of age. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2005, v:22, n:3, pp:288- [Journal]
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