Journals in DBLP
Kwang-Ting (Tim) Cheng Vision from the Top. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:261- [Journal ] Mitra Subhasish , Ondrej Novák , Hana Kubatova , Bashir M. Al-Hashimi , Erik Jan Marinissen , C. P. Ravikumar Conference Reports. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:262-265 [Journal ] Alberto Valdes-Garcia , José Silva-Martínez , Edgar Sánchez-Sinencio On-Chip Testing Techniques for RF Wireless Transceivers. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:268-277 [Journal ] Jim Plusquellic , Dhruva Acharyya , Abhishek Singh , Mohammad Tehranipoor , Chintan Patel Quiescent-Signal Analysis: A Multiple Supply Pad IDDQ Method. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:278-293 [Journal ] Nur A. Touba Survey of Test Vector Compression Techniques. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:294-303 [Journal ] Walden C. Rhines Sociology of Design and EDA. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:304-310 [Journal ] Ajay Khoche Panel Summaries: Real-Time Volume Diagnostics--Requirements and Challenges. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:315- [Journal ] Victor Berman Standards: The P1685 IP-XACT IP Metadata Standard. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:316-317 [Journal ] Sachin S. Sapatnekar Book Reviews: Plumbing the Depths of Leakage. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:318-319 [Journal ] Bruce C. Kim Test Technology TC Newsletter. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:320-323 [Journal ] CEDA Currents. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:322-325 [Journal ] Scott Davidson Who Reads This Stuff Anyway? [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 2006, v:23, n:4, pp:328- [Journal ]