Journals in DBLP

IEEE Design & Test of Computers
2000, volume: 17, number: 3

1. Yervant Zorian
   Wider Coverage. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2000, v:17, n:3, pp:6-0 [Journal]
   
2. 
   News. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2000, v:17, n:3, pp:8-10 [Journal]
   
3. Scott Davidson, Justin E. Harlow III
   Guest Editors' Introduction: Benchmarking for Design and Test. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2000, v:17, n:3, pp:12-14 [Journal]
   
4. Justin E. Harlow III
   Overview of Popular Benchmark Sets. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2000, v:17, n:3, pp:15-17 [Journal]
   
5. Rohit Kapur, Cy Hay, Thomas W. Williams
   The Mutating Metric for Benchmarking Test. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2000, v:17, n:3, pp:18-21 [Journal]
   
6. Giulio Gorla, Eduard Moser, Wolfgang Nebel, Eugenio Villar
   System Specification Experiments on a Common Benchmark. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2000, v:17, n:3, pp:22-32 [Journal]
   
7. Chouki Aktouf, Hérvé Fleury, Chantal Robach
   Inserting Scan at the Behavioral Level. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2000, v:17, n:3, pp:34-42 [Journal]
   
8. Fulvio Corno, Matteo Sonza Reorda, Giovanni Squillero
   RT-Level ITC'99 Benchmarks and First ATPG Results. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2000, v:17, n:3, pp:44-53 [Journal]
   
9. Luis Basto
   First Results of ITC'99 Benchmark Circuits. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2000, v:17, n:3, pp:54-59 [Journal]
   
10. Sujit Dey, Debashis Panigrahi, Li Chen, Clark N. Taylor, Krishna Sekar, Pablo Sanchez
    Using a Soft Core in a SoC Design: Experiences with picoJava. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:60-71 [Journal]
    
11. Chien-Nan Jimmy Liu, Jing-Yang Jou
    An Automatic Controller Extractor for HDL Descriptions at the RTL. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:72-77 [Journal]
    
12. Axel Jantsch, Shashi Kumar, Ahmed Hemani
    A Metamodel for Studying Concepts in Electronic System Design. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:78-85 [Journal]
    
13. Rolf Clauberg, Peter Buchmann, Andreas Herkersdorf, David J. Webb
    Design Methodology for a Large Communication Chip. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:86-94 [Journal]
    
14. Mauro Bertacchi, Alessandro De Gloria, Daniele Grosso, Mauro Olivieri
    Semicustom Design of an IEEE 1394-Compliant Reusable IC Core. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:95-105 [Journal]
    
15. Pramodchandran N. Variyam, Abhijit Chatterjee
    Digital-Compatible BIST for Analog Circuits Using Transient Response Sampling. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:106-115 [Journal]
    
16. Seung H. Hwang, Gwan S. Choi
    A Reliability Testing Environment for Off-the-Shelf Memory Subsystems. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:116-124 [Journal]
    
17. 
    A D&T Roundtable: Test Resource Partitioning. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:126-132 [Journal]
    
18. 
    Panel Summaries. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:133-135 [Journal]
    
19. Mukund Modi
    TTTC Reports on Recent Standards Activities. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:136-137 [Journal]
    
20. 
    DATC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:139-0 [Journal]
    
21. 
    TTTC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:140-141 [Journal]
    
22. Franc Brglez
    The Scientific Method and Design and Test. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2000, v:17, n:3, pp:142-144 [Journal]