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Journals in DBLP

IEEE Design & Test of Computers
1998, volume: 15, number: 3


  1. Conference Reports. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:2-0 [Journal]
  2. Yervant Zorian
    Once Again, a Super Issue. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:3-0 [Journal]
  3. Wilfred Corrigan
    ASIC Challenges: Emerging from a Primordial Soup. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:4-7 [Journal]
  4. David E. Schimmel, Chryssa Dislis
    Guest Editors' Introduction: Early Modeling and Analysis of Packaged Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:8-9 [Journal]
  5. Peter Sandborn, Mike Vertal
    Analyzing Packaging Trade-Offs During System Design. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:10-19 [Journal]
  6. Michael Scheffler, Daniel Ammann, Andreas Thiel, Claus M. Habiger, Gerhard Tröster
    Modeling and Optimizing the Costs of Electronic Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:20-26 [Journal]
  7. Earl E. Swartzlander Jr.
    VLSI, MCM, and WSI: A Design Comparison. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:28-34 [Journal]
  8. Claudio Truzzi
    The Role of the Good-Die Project in Miniaturized-System Design. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:35-43 [Journal]
  9. Koppolu Sasidhar, Leon Alkalai, Abhijit Chatterjee
    Testing NASA's 3D-Stack MCM Space Flight Computer. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:44-55 [Journal]
  10. Wayne M. Needham
    Guest Editor's Introduction: Microprocessor Testing Today. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:56-57 [Journal]
  11. Jeff Brauch, Jay Fleischman
    Design of Cache Test Hardware on the HP PA8500. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:58-63 [Journal]
  12. R. Scott Fetherston, Imtiaz P. Shaik, Siyad C. Ma
    Testability Features of the AMD-K6 Microprocessor. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:64-69 [Journal]
  13. Dale Amason, Alfred L. Crouch, Renny Eisele, Grady Giles, Michael Mateja
    Test Development for Second-Generation ColdFire Microprocessors. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:70-76 [Journal]
  14. Adrian Carbine, Derek Feltham
    Pentium Pro Processor Design for Test and Debug. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:77-82 [Journal]
  15. Thomas G. Foote, Dale E. Hoffman, William V. Huott, Timothy J. Koprowski, Mary P. Kusko, Bryan J. Robbins
    Testing the 500-MHz IBM S/390 Microprocessor. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:83-89 [Journal]
  16. Carol Pyron, Javier Prado, James Golab
    Test Strategy for the PowerPC 750 Microprocessor. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:90-97 [Journal]
  17. Carol Stolicny, Richard Davies, Pamela McKernan, Tuyen Truong
    Alpha 21164 Manufacturing Test Development and Coverage Analysis. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:98-104 [Journal]
  18. Dimitris Gizopoulos, Antonis M. Paschalis, Yervant Zorian
    Effective Built-In Self-Test for Booth Multipliers. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:105-111 [Journal]
  19. Michel Dubois, Jaeheon Jeong, Yong Ho Song, Adrian Moga
    Rapid Hardware Prototyping on RPM-2. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:112-118 [Journal]

  20. A D&T Roundtable: Challenges for Low-Power and High-Performance Chips. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:119-124 [Journal]

  21. Test Technology TC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:125-126 [Journal]

  22. Design Automation Technical Committee Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:126-127 [Journal]
  23. Scott Davidson
    Minutes Found on a Cave Wall. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1998, v:15, n:3, pp:128-0 [Journal]
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