Journals in DBLP

IEEE Design & Test of Computers
1999, volume: 16, number: 4

1. Yervant Zorian
   Integration Continues. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1999, v:16, n:4, pp:1-0 [Journal]
   
2. 
   News. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1999, v:16, n:4, pp:5-6 [Journal]
   
3. 
   Letter to the Editor. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1999, v:16, n:4, pp:6-0 [Journal]
   
4. Terry Thomas
   Technology for IP Reuse and Portability. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1999, v:16, n:4, pp:7-13 [Journal]
   
5. Charles F. Hawkins, Jerry M. Soden
   Deep Submicron CMOS Current IC Testing: Is There a Future? [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1999, v:16, n:4, pp:14-15 [Journal]
   
6. Bernard Courtois, R. D. (Shawn) Blanton
   Guest Editors' Introduction. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1999, v:16, n:4, pp:16-17 [Journal]
   
7. Tamal Mukherjee, Gary K. Fedder, R. D. (Shawn) Blanton
   Hierarchical Design and Test of Integrated Microsystems. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1999, v:16, n:4, pp:18-27 [Journal]
   
8. Salvador Mir, Benoît Charlot
   On the Integration of Design and Test for Chips Embedding MEMS. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1999, v:16, n:4, pp:28-38 [Journal]
   
9. Nicholas R. Swart
   A Design Flow for Micromachined Electromechanical Systems. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1999, v:16, n:4, pp:39-47 [Journal]
   
10. Alain Béliveau, Guy T. Spencer, Keith A. Thomas, Scott L. Roberson
    Evaluation of MEMS Capacitive Accelerometers. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:48-56 [Journal]
    
11. Edward K. Chan, Krishna Garikipati, Robert W. Dutton
    Comprehensive Static Characterization of Vertical Electrostatically Actuated Polysilicon Beams. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:58-65 [Journal]
    
12. Charles F. Hawkins, Jaume Segura, Jerry M. Soden, Ted Dellin
    Test and Reliability: Partners in IC Manufacturing, Part 2. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:66-73 [Journal]
    
13. Peter J. Ashenden, Philip A. Wilsey
    Protected Shared Variables in VHDL: IEEE Standard 1076a. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:74-83 [Journal]
    
14. Ralph Mason, Shing Ma
    Analog DFT Using an Undersampling Technique. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:84-88 [Journal]
    
15. 
    A D&T Roundtable: Design Automation in Europe. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:90-95 [Journal]
    
16. Dilip K. Bhavsar
    ITC 99 Panels. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:96-99 [Journal]
    
17. 
    Conference Reports. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:100-101 [Journal]
    
18. 
    IEEE Design & Test of Computers 1999 Annual Index, Volume 16. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:102-108 [Journal]
    
19. 
    DATC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:109-0 [Journal]
    
20. 
    TTTC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:110-111 [Journal]
    
21. Chris Rowen
    Sailing on a Sea of Processors. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1999, v:16, n:4, pp:112-0 [Journal]