|
Journals in DBLP
News. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:2-4 [Journal]
- Andrew J. Graham
The DAD Reamework Interactive. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:12-15 [Journal]
- William R. Simpson, John W. Sheppard
System Complexity and Integrated Diagnostics. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:16-30 [Journal]
- Paul S. Levy
Designing in Power-Down Test Circuits. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:31-35 [Journal]
- G. Antonin, H.-D. Oberle, J. Kolzer
Electrical Characterization of Megabit DRAMs, Part 1: External Testing. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:36-43 [Journal]
- Bjorn Dahlberg
Increasing Test Accuracy by Varying Driver Slew Rate. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:44-48 [Journal]
- Rajiv Gupta, Rajagopalan Srinivasan, Melvin A. Breuer
Reorganizing Circuits to Aid Testability. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:49-57 [Journal]
- Prawat Nagvajara, Mark G. Karpovsky, Lev B. Levitin
Pseudorandom Testing for Boundary-Scan Design with Built-In Self-Test. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:58-65 [Journal]
A D&T Roundtable: Design for Manufacturability. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:66-76 [Journal]
Conference Reports. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:78-84 [Journal]
Product Review. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:86-0 [Journal]
Book Review. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:90-91 [Journal]
TTTC Newsletter. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:92-93 [Journal]
DATC Newsletter. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1991, v:8, n:3, pp:94-95 [Journal]
|