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Journals in DBLP

IEEE Design & Test of Computers
2006, volume: 23, number: 3

  1. Kwang-Ting (Tim) Cheng
    The Need for a SiP Design and Test Infrastructure. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:181- [Journal]
  2. Sachin S. Sapatnekar, Grant Martin
    DAC Highlights. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:182-184 [Journal]
  3. Fabian Vargas
    2006 Latin American Test Workshop. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:185- [Journal]
  4. Bruce C. Kim, Yervant Zorian
    Guest Editors' Introduction: Big Innovations in Small Packages. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:186-187 [Journal]
  5. Peter Rickert, William Krenik
    Cell Phone Integration: SiP, SoC, and PoP. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:188-195 [Journal]
  6. Thomas Brandtner
    Chip-Package Codesign Flow for Mixed-Signal SiP Designs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:196-202 [Journal]
  7. Davide Appello, Paolo Bernardi, Michelangelo Grosso, Matteo Sonza Reorda
    System-in-Package Testing: Problems and Solutions. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:203-211 [Journal]
  8. Dong Gun Kam, Joungho Kim, Jiheon Yu, Ho Choi, Kicheol Bae, Choonheung Lee
    Packaging a 40-Gbps Serial Link Using a Wire-Bonded Plastic Ball Grid Array. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:212-219 [Journal]
  9. Vijay K. Madisetti
    Electronic System, Platform, and Package Codesign. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:220-233 [Journal]
  10. Vincent Kerzerho, Philippe Cauvet, Serge Bernard, Florence Azaïs, Mariane Comte, Michel Renovell
    A Novel DFT Technique for Testing Complete Sets of ADCs and DACs in Complex SiPs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:234-243 [Journal]
  11. Grant Martin
    The First Transaction, but not the Last. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:248-249 [Journal]
  12. Bruce C. Kim
    Test Technology Technical Council Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:250- [Journal]

  13. CEDA Currents. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:252-253 [Journal]
  14. T. M. Mak
    Is System in Package the Panacea for Integration? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:3, pp:256- [Journal]
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