Journals in DBLP

IEEE Design & Test of Computers
1990, volume: 7, number: 2

1. M. Ray Mercer
   Guest Editorial: ITC 20th Anniversary. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:2, pp:2-3 [Journal]
   
2. Christopher W. Branson
   Integrating Tester Pin Electronics. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:2, pp:4-14 [Journal]
   
3. Robert W. Bassett, Barry J. Butkus, Stephen L. Dingle, Marc R. Faucher, Pamela S. Gillis, Jeannie H. Panner, John G. Petrovick, Donald L. Wheater
   Low-Cost Testing of High-Density Logic Components. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:2, pp:15-28 [Journal]
   
4. Richard Illman, Stephen Clarke
   Built-In Self-Test of the Macrolan Chip. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:2, pp:29-40 [Journal]
   
5. Frans P. M. Beenker, Barry J. Dekker, Richard Stans, Max Van der Star
   Implementing Macro Test in Silicon Compiler Design. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:2, pp:41-51 [Journal]
   
6. Benoit Nadeau-Dostie, Allan Silburt, Vinod K. Agarwal
   Serial Interfacing for Embedded-Memory Testing. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:2, pp:52-63 [Journal]
   
7. 
   A D&T Roundtable: Behavioral Description Languages, Part 2: VHDL vs. UDL/I. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:2, pp:64-68 [Journal]
   
8. 
   TTTC Newsletter. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:2, pp:70-71 [Journal]