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Journals in DBLP
EIC Message. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:3-0 [Journal]
- William H. Joyner Jr., Andrew B. Kahng
Guest Editor's Introduction: Roadmaps and Visions for Design and Test. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:4-5 [Journal]
Perspectives. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:6-11 [Journal]
- Dennis Sylvester, Himanshu Kaul
Power-Driven Challenges in Nanometer Design. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:12-22 [Journal]
- Alberto L. Sangiovanni-Vincentelli, Grant Martin
Platform-Based Design and Software Design Methodology for Embedded Systems. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:23-33 [Journal]
- Ralf Brederlow, Werner Weber, Joseph Sauerer, Stéphane Donnay, Piet Wambacq, Maarten Vertregt
A Mixed-Signal Design Roadmap. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:34-46 [Journal]
- Rohit Kapur, R. Chandramouli, Thomas W. Williams
Strategies for Low-Cost Test. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:47-54 [Journal]
- Kevin Stanley
High-Accuracy Flush-and-Scan Software Diagnostic. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:56-62 [Journal]
Conference Reports. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:64-65 [Journal]
Panel Summaries. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:66-67 [Journal]
TTTC Newsletter. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:68-0 [Journal]
DATC Newsletter. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:69-0 [Journal]
Annual Index. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:70-79 [Journal]
The Last Byte. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:6, pp:80-0 [Journal]
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