Journals in DBLP

IEEE Design & Test of Computers
2006, volume: 23, number: 2

1. Kwang-Ting (Tim) Cheng
   Dealing with early life failures. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:2, pp:85- [Journal]
   
2. Phil Nigh
   Guest Editor's Introduction: Evolving Methods for Detecting and Handling Reliability Defects. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:2, pp:86-87 [Journal]
   
3. Mohd Fairuz Zakaria, Zainal Abu Kassim, Melanie Po-Leen Ooi, Serge N. Demidenko
   Reducing Burn-in Time through High-Voltage Stress Test and Weibull Statistical Analysis. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:2, pp:88-98 [Journal]
   
4. Ritesh P. Turakhia, W. Robert Daasch, Joel Lurkins, Brady Benware
   Changing Test and Data Modeling Requirements for Screening Latent Defects as Statistical Outliers. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:2, pp:100-109 [Journal]
   
5. Thomas S. Barnett, Matt Grady, Kathleen G. Purdy, Adit D. Singh
   Combining Negative Binomial and Weibull Distributions for Yield and Reliability Prediction. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:2, pp:110-116 [Journal]
   
6. John M. Carulli Jr., Thomas J. Anderson
   The Impact of Multiple Failure Modes on Estimating Product Field Reliability. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:2, pp:118-126 [Journal]
   
7. Kaushik Roy, T. M. Mak, Kwang-Ting (Tim) Cheng
   Test Consideration for Nanometer-Scale CMOS Circuits. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:2, pp:128-136 [Journal]
   
8. Selahattin Sayil
   Optical Contactless Probing: An All-Silicon, Fully Optical Approach. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:2, pp:138-146 [Journal]
   
9. Jérôme Chevalier, Maxime de Nanclas, Luc Filion, Olivier Benny, Mathieu Rondonneau, Guy Bois, El Mostapha Aboulhamid
   A SystemC Refinement Methodology for Embedded Software. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2006, v:23, n:2, pp:148-158 [Journal]
   
10. Brian Bailey
    Was it worth the wait? Yes! [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:160-161 [Journal]
    
11. Scott Davidson
    An insider's look at microprocessor design. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:162-163 [Journal]
    
12. Carol Stolicny
    ITC 2005 panels. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:164-166 [Journal]
    
13. Sandip Kundu
    TTTC technical forum honoring Sudhakar M. Reddy. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:167- [Journal]
    
14. Kartikeya Mayaram
    CEDA Currents. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:168-171 [Journal]
    
15. 
    TTTC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:175- [Journal]
    
16. Burnell West
    Making more out of open-source tools. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:2, pp:176- [Journal]