Variety at Its Best. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1999, v:16, n:2, pp:1-0 [Journal]
News. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1999, v:16, n:2, pp:3-4 [Journal]
Mukund Modi Mixed-Signal Test Bus, Embedded Core Test Efforts Advance. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1999, v:16, n:2, pp:5-6 [Journal]
Conference Reports. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1999, v:16, n:2, pp:7-93 [Journal]
Gordon E. Moore: A Pioneer Looks Back at Semiconductors. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1999, v:16, n:2, pp:8-14 [Journal]
Vijay K. Madisetti Guest Editor's Introduction: Reengineering Digital Systems. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1999, v:16, n:2, pp:15-16 [Journal]
IC Reliability and Test: What Will Deep Submicron Bring? [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1999, v:16, n:2, pp:84-91 [Journal]
Test Technology TC Newsletter. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 1999, v:16, n:2, pp:94-95 [Journal]