Journals in DBLP
D&T to greet new EIC. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:1-0 [Journal ] Victor P. Nelson Which tester is right for your MCM? [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:4-5 [Journal ] Conference Reports. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:5-6 [Journal ] Burton J. Smith Burton Smith's Multithreaded Success Strategy. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:7-13 [Journal ] Yervant Zorian , Rajesh K. Gupta Design and Test of Core-Based Systems on Chips. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:14-0 [Journal ] Rajesh K. Gupta , Yervant Zorian Introducing Core-Based System Design. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:15-25 [Journal ] Ann Marie Rincon , Cory Cherichetti , James A. Monzel , David R. Stauffer , Michael T. Trick Core Design and System-on-a-Chip Integration. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:26-35 [Journal ] Frank S. Eory A Core-Based System-to-Silicon Design Methodology. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:36-41 [Journal ] Vijay K. Madisetti , Lan Shen Interface Design for Core-Based Systems. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:42-51 [Journal ] Nur A. Touba , Bahram Pouya Using Partial Isolation Rings to Test Core-Based Designs. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:52-59 [Journal ] Mika Kuulusa , Jari Nurmi , Janne Takala , Pasi Ojala , Henrik Herranen A Flexible DSP Core for Embedded Systems. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:60-68 [Journal ] Fabrizio Ferrandi , Franco Fummi , Donatella Sciuto , Enrico Macii , Massimo Poncino Testing Core-Based Systems: A Symbolic Methodology. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:69-77 [Journal ] Keith A. Jenkins Detecting and Preventing Measurement Errors. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:78-86 [Journal ] Al Crouch , Jeff Freeman Designing and Verifying Embedded Microprocessors. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:87-94 [Journal ] A D&T Roundtable: What's Next for Microelectronics Education? [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:95-102 [Journal ] IEEE Design & Test of Computers: 1997 Annual Index, Volume 14. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:103-107 [Journal ] DDATC Newsletter. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:108-109 [Journal ] Tttc Newsletter. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:110-111 [Journal ] Lee Whetsel A silicon El Niño? [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1997, v:14, n:4, pp:112-0 [Journal ]