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Journals in DBLP

Electr. Notes Theor. Comput. Sci.
2005, volume: 111, number:

  1. Keith Stobie
    Model Based Testing in Practice at Microsoft. [Citation Graph (0, 0)][DBLP]
    Electr. Notes Theor. Comput. Sci., 2005, v:111, n:, pp:5-12 [Journal]
  2. Mirko Conrad, Ines Fey, Sadegh Sadeghipour
    Systematic Model-Based Testing of Embedded Automotive Software. [Citation Graph (0, 0)][DBLP]
    Electr. Notes Theor. Comput. Sci., 2005, v:111, n:, pp:13-26 [Journal]
  3. Giuseppe Scollo, Silvia Zecchini
    Architectural Unit Testing. [Citation Graph (0, 0)][DBLP]
    Electr. Notes Theor. Comput. Sci., 2005, v:111, n:, pp:27-52 [Journal]
  4. Antti Kervinen, Pablo Virolainen
    Heuristics for Faster Error Detection With Automated Black Box Testing. [Citation Graph (0, 0)][DBLP]
    Electr. Notes Theor. Comput. Sci., 2005, v:111, n:, pp:53-71 [Journal]
  5. Seung Mo Cho, Jae Wook Lee
    Lightweight Specification-based Testing of Memory Cards: A Case Study. [Citation Graph (0, 0)][DBLP]
    Electr. Notes Theor. Comput. Sci., 2005, v:111, n:, pp:73-91 [Journal]
  6. Bruno Marre, Benjamin Blanc
    Test Selection Strategies for Lustre Descriptions in GATeL. [Citation Graph (0, 0)][DBLP]
    Electr. Notes Theor. Comput. Sci., 2005, v:111, n:, pp:93-111 [Journal]
  7. Manoranjan Satpathy, Michael Leuschel, Michael J. Butler
    ProTest: An Automatic Test Environment for B Specifications. [Citation Graph (0, 0)][DBLP]
    Electr. Notes Theor. Comput. Sci., 2005, v:111, n:, pp:113-136 [Journal]
  8. Victor V. Kuliamin
    Multi-paradigm Models as Source for Automated Test Construction. [Citation Graph (0, 0)][DBLP]
    Electr. Notes Theor. Comput. Sci., 2005, v:111, n:, pp:137-160 [Journal]
  9. Hans-Gerhard Groß, Ina Schieferdecker, George Din
    Model-Based Built-In Tests. [Citation Graph (0, 0)][DBLP]
    Electr. Notes Theor. Comput. Sci., 2005, v:111, n:, pp:161-182 [Journal]
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