Journals in DBLP
Bernd Finkbeiner , Yuri Gurevich , Alexander K. Petrenko Preface. [Citation Graph (0, 0)][DBLP ] Electr. Notes Theor. Comput. Sci., 2006, v:164, n:4, pp:1- [Journal ] Mirko Conrad , Alexander Krupp An Extension of the Classification-Tree Method for Embedded Systems for the Description of Events. [Citation Graph (0, 0)][DBLP ] Electr. Notes Theor. Comput. Sci., 2006, v:164, n:4, pp:3-11 [Journal ] N. C. W. M. Braspenning , J. M. van de Mortel-Fronczak , J. E. Rooda A Model-based Integration and Testing Method to Reduce System Development Effort. [Citation Graph (0, 0)][DBLP ] Electr. Notes Theor. Comput. Sci., 2006, v:164, n:4, pp:13-28 [Journal ] Daniel Aguiar da Silva , Patrícia D. L. Machado Towards Test Purpose Generation from CTL Properties for Reactive Systems. [Citation Graph (0, 0)][DBLP ] Electr. Notes Theor. Comput. Sci., 2006, v:164, n:4, pp:29-40 [Journal ] Sean Callanan , Radu Grosu , Abhishek Rai , Scott A. Smolka , Mike R. True , Erez Zadok Runtime Verification for High-Confidence Systems: A Monte Carlo Approach. [Citation Graph (0, 0)][DBLP ] Electr. Notes Theor. Comput. Sci., 2006, v:164, n:4, pp:41-52 [Journal ] Antti Kervinen , Mika Maunumaa , Mika Katara Controlling Testing Using Three-Tier Model Architecture. [Citation Graph (0, 0)][DBLP ] Electr. Notes Theor. Comput. Sci., 2006, v:164, n:4, pp:53-66 [Journal ] Constantinos Djouvas , Nancy D. Griffeth , Nancy A. Lynch Testing Self-Similar Networks. [Citation Graph (0, 0)][DBLP ] Electr. Notes Theor. Comput. Sci., 2006, v:164, n:4, pp:67-82 [Journal ] Igor B. Bourdonov , Alexander Kossatchev , Victor V. Kuliamin Formal Conformance Testing of Systems with Refused Inputs and Forbidden Actions. [Citation Graph (0, 0)][DBLP ] Electr. Notes Theor. Comput. Sci., 2006, v:164, n:4, pp:83-96 [Journal ] Robert Nilsson , Jeff Offutt , Jonas Mellin Test Case Generation for Mutation-based Testing of Timeliness. [Citation Graph (0, 0)][DBLP ] Electr. Notes Theor. Comput. Sci., 2006, v:164, n:4, pp:97-114 [Journal ] Bernhard K. Aichernig , Chris George When Model-based Testing Fails. [Citation Graph (0, 0)][DBLP ] Electr. Notes Theor. Comput. Sci., 2006, v:164, n:4, pp:115-128 [Journal ]