Journals in DBLP

IEEE Expert
1991, volume: 6, number: 6

1. Nancy Martin, Howell Huws
   Finding method in Madness. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1991, v:6, n:6, pp:2-3 [Journal]
   
2. Robert Milne
   Model-based reasoning: The applications gap. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1991, v:6, n:6, pp:5-7 [Journal]
   
3. Ciamac Cyrus Moallemi
   Classifying Cells for Cancer Diagnosis Using Neural Networks. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1991, v:6, n:6, pp:8-12 [Journal]
   
4. Dean Allemang
   Using Functional Models in Automatic Debugging. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1991, v:6, n:6, pp:13-18 [Journal]
   
5. Janet L. Murdock, Barbara Hayes-Roth
   Intelligent Monitoring and Control of Semiconductor Manufacturing Equipment. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1991, v:6, n:6, pp:19-31 [Journal]
   
6. J. Ross Quinlan
   Knowledge Acquisition from Structured Data: Using Determinate Literals to Assist Search. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1991, v:6, n:6, pp:32-37 [Journal]
   
7. Hwee Tou Ng
   Model-Based, Multiple-Fault Diagnosis of Dynamic, Continuous Physical Devices. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1991, v:6, n:6, pp:38-43 [Journal]
   
8. 
   The Japanese mechatronic revolution. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1991, v:6, n:6, pp:44-45 [Journal]
   
9. 
   News. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1991, v:6, n:6, pp:46-48 [Journal]
   
10. 
    Conferences. [Citation Graph (0, 0)][DBLP]
    IEEE Expert, 1991, v:6, n:6, pp:49-71 [Journal]
    
11. Scott R. Turner
    Nexpert Object. [Citation Graph (0, 0)][DBLP]
    IEEE Expert, 1991, v:6, n:6, pp:72-77 [Journal]
    
12. 
    New Products. [Citation Graph (0, 0)][DBLP]
    IEEE Expert, 1991, v:6, n:6, pp:78-80 [Journal]
    
13. 
    Book Reviews. [Citation Graph (0, 0)][DBLP]
    IEEE Expert, 1991, v:6, n:6, pp:81-0 [Journal]
    
14. 
    New Books. [Citation Graph (0, 0)][DBLP]
    IEEE Expert, 1991, v:6, n:6, pp:82-0 [Journal]