Journals in DBLP

IEEE Expert
1990, volume: 5, number: 2

1. Ware Myers
   Interview: John Hopfield. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1990, v:5, n:2, pp:3-6 [Journal]
   
2. Hamid Noori
   KILS: A Prototypical Expert System for Assessing Technologies. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1990, v:5, n:2, pp:8-14 [Journal]
   
3. Pi-Sheng Deng, Clyde W. Holsapple, Andrew B. Whinston
   A Skill Refinement Learning Model for Rule-Based Expert Systems. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1990, v:5, n:2, pp:15-28 [Journal]
   
4. Keung-Chi Ng, Bruce Abramson
   Uncertainty Management in Expert Systems. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1990, v:5, n:2, pp:29-48 [Journal]
   
5. Francois Jakob, Pierre Suslenschi
   Situation Assessment for Process Control. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1990, v:5, n:2, pp:49-59 [Journal]
   
6. Roy Rada
   An Expert System for Journal Selection. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1990, v:5, n:2, pp:60-68 [Journal]
   
7. Bernard Moulin
   Strategic Planning for Expert Systems. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1990, v:5, n:2, pp:69-75 [Journal]
   
8. R. Narasimhan
   Human Intelligence and AI: How Close are We to Bridging the Gap? [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1990, v:5, n:2, pp:77-79 [Journal]
   
9. Angelo Bravos, Tom J. Schwartz
   News: Conferences. [Citation Graph (0, 0)][DBLP]
   IEEE Expert, 1990, v:5, n:2, pp:80-84 [Journal]
   
10. 
    Resources. [Citation Graph (0, 0)][DBLP]
    IEEE Expert, 1990, v:5, n:2, pp:85-91 [Journal]
    
11. 
    Products. [Citation Graph (0, 0)][DBLP]
    IEEE Expert, 1990, v:5, n:2, pp:92-96 [Journal]