Jean L. Jordan-Sweet Synchrotron X-ray scattering techniques for microelectronics-related materials studies. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 2000, v:44, n:4, pp:457-476 [Journal]
Philip E. Batson Atomic resolution analytical microscopy. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 2000, v:44, n:4, pp:477-488 [Journal]
Frances M. Ross Growth processes and phase transformations studied in situ transmission electron microscopy. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 2000, v:44, n:4, pp:489-502 [Journal]
Rudolf Ludeke Hot-electron effects and oxide degradation in MOS structures studied with ballistic electron emission microscopy. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 2000, v:44, n:4, pp:517-534 [Journal]
Rolf Allenspach Spin-polarized scanning electron microscopy. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 2000, v:44, n:4, pp:553-570 [Journal]
Matthew Copel Medium-energy ion scattering for analysis of microelectronic materials. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 2000, v:44, n:4, pp:571-582 [Journal]
Erik Elmroth, Fred G. Gustavson Applying recursion to serial and parallel QR factorization leads to better performance. [Citation Graph (0, 0)][DBLP] IBM Journal of Research and Development, 2000, v:44, n:4, pp:605-624 [Journal]
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