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Journals in DBLP

Integration
1998, volume: 26, number: 1-2

  1. Bernd Becker
    Testing with decision diagrams. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:5-20 [Journal]
  2. Irith Pomeranz, Sudhakar M. Reddy
    Delay fault models for VLSI circuits1. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:21-40 [Journal]
  3. Yong Chang Kim, Kewal K. Saluja
    Sequential test generators: past, present and future. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:41-54 [Journal]
  4. Hans-Joachim Wunderlich
    BIST for systems-on-a-chip. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:55-78 [Journal]
  5. Indradeep Ghosh, Niraj K. Jha
    High-level test synthesis: a survey. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:79-99 [Journal]
  6. Michiko Inoue, Hideo Fujiwara
    An approach to test synthesis from higher level. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:101-116 [Journal]
  7. Anurag Gupta, Kanad Chakraborty, Pinaki Mazumder
    FTROM: A Silicon Compiler for Fault-tolerant ROMs. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:117-140 [Journal]
  8. Vishwani D. Agrawal
    Design of mixed-signal systems for testability. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:141-150 [Journal]
  9. Mani Soma
    Mixed-signal on-chip timing measurements. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:151-165 [Journal]
  10. Antoni Ferré, Eugeni Isern, Josep Rius, Rosa Rodríguez-Montañés, Joan Figueras
    IDDQ testing: state of the art and future trends. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:167-196 [Journal]
  11. Michael Nicolaidis
    On-line testing for VLSI: state of the art and trends. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:197-209 [Journal]
  12. Masahide Nakamura, Tohru Kikuno
    A new approach in feature interaction testing. [Citation Graph (0, 0)][DBLP]
    Integration, 1998, v:26, n:1-2, pp:211-223 [Journal]
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