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Journals in DBLP

IEEE Trans. Pattern Anal. Mach. Intell.
1988, volume: 10, number: 1

  1. Jorge L. C. Sanz
    Introduction to the Special PAMI Issues on Industrial Machine Vision and Computer Vision Technology. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:1-3 [Journal]
  2. Haruo Yoda, Yozo Ohuchi, Yuzo Taniguchi, Masakazu Ejiri
    An Automatic Wafer Inspection System Using Pipelined Image Processing Techniques. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:4-16 [Journal]
  3. H. Keith Nishihara, P. A. Crossley
    Measuring Photolithographic Overlay Accuracy and Critical Dimensions by Correlating Binarized Laplacian of Gaussian Convolutions. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:17-30 [Journal]
  4. Sandra L. Bartlett, Paul J. Besl, Charles L. Cole, Ramesh Jain, Debashish Mukherjee, Kurt D. Skifstad
    Automatic Solder Joint Inspection. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:31-43 [Journal]
  5. Arthur S. Sanderson, Lee E. Weiss, Shree K. Nayar
    Structured Highlight Inspection of Specular Surfaces. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:44-55 [Journal]
  6. Ahmed M. Darwish, Anil K. Jain
    A Rule Based Approach for Visual Pattern Inspection. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:56-68 [Journal]
  7. Yasuhiko Hara, Hideaki Doi, Koichi Karasaki, Tadashi Iida
    A System for PCB Automated Inspection Using Fluorescent Light. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:69-78 [Journal]
  8. Herbert Boerner, Helmut Strecker
    Automated X-Ray Inspection of Aluminum Castings. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:79-91 [Journal]
  9. Lee Hok Siew, Robert M. Hodgson, Errol J. Wood
    Texture Measures for Carpet Wear Assessment. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:92-105 [Journal]
  10. F. Matthew Rhodes, Joseph J. Dituri, Glenn H. Chapman, Bruce E. Emerson, Antonio M. Soares, Jack I. Raffel
    A Monolithic Hough Transform Processor Based on Restructurable VLSI. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:106-110 [Journal]
  11. E. Persoon
    A Pipelined Image Analysis System Using Custom Integrated Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:110-116 [Journal]
  12. D. B. Shu, C. C. Li, J. F. Mancuso, Y. N. Sun
    A Line Extraction Method for Automated SEM Inspection of VLSI Resist. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:117-120 [Journal]
  13. Keishi Hanahara, Tsugito Maruyama, Takashi Uchiyama
    A Real-Time Processor for the Hough Transform. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 1988, v:10, n:1, pp:121-125 [Journal]
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