Journals in DBLP

IEEE Trans. Pattern Anal. Mach. Intell.
2001, volume: 23, number: 5

1. Nicolae Duta, Anil K. Jain, Marie-Pierre Dubuisson-Jolly
   Automatic Construction of 2D Shape Models. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2001, v:23, n:5, pp:433-446 [Journal]
   
2. Stiliyan Kalitzin, Joes Staal, Bart M. ter Haar Romeny, Max A. Viergever
   A Computational Method for Segmenting Topological Point-Sets and Application to Image Analysis. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2001, v:23, n:5, pp:447-459 [Journal]
   
3. Gabor T. Herman, Bruno M. Carvalho
   Multiseeded Segmentation Using Fuzzy Connectedness. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2001, v:23, n:5, pp:460-474 [Journal]
   
4. Stan Sclaroff, Lifeng Liu
   Deformable Shape Detection and Description via Model-Based Region Grouping. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2001, v:23, n:5, pp:475-489 [Journal]
   
5. Hemant Tagare, Kentaro Toyama, Jonathan G. Wang
   A Maximum-Likelihood Strategy for Directing Attention during Visual Search. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2001, v:23, n:5, pp:490-500 [Journal]
   
6. Sanjay Noronha, Ramakant Nevatia
   Detection and Modeling of Buildings from Multiple Aerial Images. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2001, v:23, n:5, pp:501-518 [Journal]
   
7. Ronen Basri, David W. Jacobs
   Projective Alignment with Regions. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2001, v:23, n:5, pp:519-527 [Journal]
   
8. Michael Werman, Daniel Keren
   A Bayesian Method for Fitting Parametric and Nonparametric Models to Noisy Data. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2001, v:23, n:5, pp:528-534 [Journal]
   
9. Philip L. Worthington, Edwin R. Hancock
   Object Recognition Using Shape-from-Shading. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2001, v:23, n:5, pp:535-542 [Journal]