Geir Storvik A Bayesian Approach to Dynamic Contours Through Stochastic Sampling and Simulated Annealing. [Citation Graph (0, 0)][DBLP] IEEE Trans. Pattern Anal. Mach. Intell., 1994, v:16, n:10, pp:976-986 [Journal]
Kim L. Boyer, Muhammad J. Mirza, Gopa Ganguly The Robust Sequential Estimator: A General Approach and its Application to Surface Organization in Range Data. [Citation Graph (0, 0)][DBLP] IEEE Trans. Pattern Anal. Mach. Intell., 1994, v:16, n:10, pp:987-1001 [Journal]
Punam K. Saha, B. B. Chaudhuri Detection of 3-D Simple Points for Topology Preserving Transformations with Application to Thinning. [Citation Graph (0, 0)][DBLP] IEEE Trans. Pattern Anal. Mach. Intell., 1994, v:16, n:10, pp:1028-1032 [Journal]
John Canning A Minimum Description Length Model for Recognizing Objects with Variable Appearances (The VAPOR model). [Citation Graph (0, 0)][DBLP] IEEE Trans. Pattern Anal. Mach. Intell., 1994, v:16, n:10, pp:1032-1036 [Journal]
Richard I. Hartley Projective Reconstruction and Invariants from Multiple Images. [Citation Graph (0, 0)][DBLP] IEEE Trans. Pattern Anal. Mach. Intell., 1994, v:16, n:10, pp:1036-1041 [Journal]
Xiaoping Hu, Narendra Ahuja Matching Point Features with Ordered Geometric, Rigidity, and Disparity Constraints. [Citation Graph (0, 0)][DBLP] IEEE Trans. Pattern Anal. Mach. Intell., 1994, v:16, n:10, pp:1041-1049 [Journal]