Journals in DBLP

IEEE Trans. Pattern Anal. Mach. Intell.
2005, volume: 27, number: 3

1. Iain McCowan, Daniel Gatica-Perez, Samy Bengio, Guillaume Lathoud, Mark Barnard, Dong Zhang
   Automatic Analysis of Multimodal Group Actions in Meetings. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:305-317 [Journal]
   
2. Tae-Kyun Kim, Josef Kittler
   Locally Linear Discriminant Analysis for Multimodally Distributed Classes for Face Recognition with a Single Model Image. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:318-327 [Journal]
   
3. Xiaofei He, Shuicheng Yan, Yuxiao Hu, Partha Niyogi, HongJiang Zhang
   Face Recognition Using Laplacianfaces. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:328-340 [Journal]
   
4. Philip de Chazal, John Flynn, Richard B. Reilly
   Automated Processing of Shoeprint Images Based on the Fourier Transform for Use in Forensic Science. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:341-350 [Journal]
   
5. Toshiyuki Kirishima, Kosuke Sato, Kunihiro Chihara
   Real-Time Gesture Recognition by Learning and Selective Control of Visual Interest Points. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:351-364 [Journal]
   
6. Antonio Robles-Kelly, Edwin R. Hancock
   Graph Edit Distance from Spectral Seriation. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:365-378 [Journal]
   
7. Arun Qamra, Yan Meng, Edward Y. Chang
   Enhanced Perceptual Distance Functions and Indexing for Image Replica Recognition. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:379-391 [Journal]
   
8. Ryusuke Sagawa, Ko Nishino, Katsushi Ikeuchi
   Adaptively Merging Large-Scale Range Data with Reflectance Properties. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:392-405 [Journal]
   
9. Paolo Favaro, Stefano Soatto
   A Geometric Approach to Shape from Defocus. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:406-417 [Journal]
   
10. Maxime Lhuillier, Long Quan
    A Quasi-Dense Approach to Surface Reconstruction from Uncalibrated Images. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:418-433 [Journal]
    
11. Wai-Shun Tong, Chi-Keung Tang
    Robust Estimation of Adaptive Tensors of Curvature by Tensor Voting. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:434-449 [Journal]
    
12. Robert Snelick, Umut Uludag, Alan Mink, Mike Indovina, Anil K. Jain
    Large-Scale Evaluation of Multimodal Biometric Authentication Using State-of-the-Art Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:450-455 [Journal]
    
13. Sang-Woon Kim, B. John Oommen
    On Using Prototype Reduction Schemes and Classifier Fusion Strategies to Optimize Kernel-Based Nonlinear Subspace Methods. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:455-460 [Journal]
    
14. Jaewook Lee, Daewon Lee
    An Improved Cluster Labeling Method for Support Vector Clustering. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:461-464 [Journal]
    
15. Giovanni Marola
    A Technique for Finding the Symmetry Axes of Implicit Polynomial Curves under Perspective Projection. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:465-470 [Journal]
    
16. Mark Fashing, Carlo Tomasi
    Mean Shift Is a Bound Optimization. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:471-474 [Journal]
    
17. Sundar Vedula, Simon Baker, Peter Rander, Robert T. Collins, Takeo Kanade
    Three-Dimensional Scene Flow. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Pattern Anal. Mach. Intell., 2005, v:27, n:3, pp:475-480 [Journal]