R. W. Rowe, W. I. Keyes Application of a distance-based method for analysing spatial patterns to the analysis of radionuclide tomograms. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:11-15 [Journal]
T. P. Clement The extraction of line-structured data from engineering drawings. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:43-52 [Journal]
Pavel Pudil, Svatopluk Bláha Evaluation of the effectiveness of features selected by discriminant analysis methods. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:81-85 [Journal]
Ikuo Fukui TV image processing to determine the position of a robot vehicle. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:101-109 [Journal]
Monique Pavel Algebraic, topological and categorical aspects of pattern recognition: A survey. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:117-120 [Journal]
Fuat Ince The application of the coalescence clustering algorithm to remotely sensed multispectral data. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:121-126 [Journal]
Russell B. Ives The application of advanced pattern recognition techniques for the discrimination between earthquakes and nuclear detonations. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:155-161 [Journal]
B. M. Jones, Peter Saraga The application of parallel projections to three-dimensional object location in industrial assembly. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:163-171 [Journal]
R. E. Blake Software support for the construction of syntactic pattern recognisers by a research engineer. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:205-210 [Journal]
Johji Tajima Automatic classification of micro-organisms by shape and color, in water quality control: A preliminary study. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:211-217 [Journal]
G. B. Porter An application of grey level image processing to an industrial dimensional inspection problem. [Citation Graph (0, 0)][DBLP] Pattern Recognition, 1981, v:14, n:1-6, pp:405-410 [Journal]
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