Journals in DBLP
Edgard Nyssen Evaluation of pattern classifiers - Applying a Monte Carlo significance test to the classification efficiency. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:1-6 [Journal ] Patrick C. Teo , Yacov Hel-Or Lie generators for computing steerable functions. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:7-17 [Journal ] Qiuming Zhu , Yao Cai A subclass model for non-linear pattern classification. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:19-29 [Journal ] Peng-Yeng Yin Algorithms for straight line fitting using k-means. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:31-41 [Journal ] Manish Sarkar , B. Yegnanarayana , Deepak Khemani Backpropagation learning algorithms for classification with fuzzy mean square error. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:43-51 [Journal ] Y. B. Karasik A recursive formula for convolutions/correlations and its application in pattern recognition. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:53-56 [Journal ] Adam Józwik , Sebastiano B. Serpico , Fabio Roli A parallel network of modified 1-NN and k-NN classifiers - Application to remote-sensing image classification. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:57-62 [Journal ] Paul L. Rosin Determining local natural scales of curves. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:63-75 [Journal ] Xose R. Fernández-Vidal , Jose A. García , Joaquín Fernández-Valdivia Using models of feature perception in distortion measure guidance. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:77-88 [Journal ] Luciano Alparone , Andrea Garzelli Decimated geometric filter for edge-preserving smoothing of non-white image noise. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:89-96 [Journal ] Herke Jan Noordmans , Arnold W. M. Smeulders High accuracy tracking of 2D/3D curved line-structures by consecutive cross-section matching. [Citation Graph (0, 0)][DBLP ] Pattern Recognition Letters, 1998, v:19, n:1, pp:97-111 [Journal ]