Journals in DBLP

IEEE Trans. Computers
1984, volume: 33, number: 6

1. Jacob Savir, Paul H. Bardell
   On Random Pattern Test Length. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1984, v:33, n:6, pp:467-474 [Journal]
   
2. Dhananjay Brahme, Jacob A. Abraham
   Functional Testing of Microprocessors. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1984, v:33, n:6, pp:475-485 [Journal]
   
3. Anton T. Dahbura, Gerald M. Masson
   An O(n^2.5) Fault Identification Algorithm for Diagnosable Systems. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1984, v:33, n:6, pp:486-492 [Journal]
   
4. Yuval Tamir, Carlo H. Séquin
   Design and Application of Self-Testing Comparators Implemented with MOS PLA's. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1984, v:33, n:6, pp:493-506 [Journal]
   
5. T. S. Liu
   The Role of a Maintenance Processor for a General-Purpose Computer System. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1984, v:33, n:6, pp:507-517 [Journal]
   
6. Kuang-Hua Huang, Jacob A. Abraham
   Algorithm-Based Fault Tolerance for Matrix Operations. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1984, v:33, n:6, pp:518-528 [Journal]
   
7. Kang G. Shin, Yann-Hang Lee
   Error Detection Process - Model, Design, and Its Impact on Computer Performance. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1984, v:33, n:6, pp:529-540 [Journal]
   
8. Edward J. McCluskey
   Verification Testing - A Pseudoexhaustive Test Technique. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1984, v:33, n:6, pp:541-546 [Journal]
   
9. Joseph L. A. Hughes, Edward J. McCluskey, David J. Lu
   Design of Totally Self-Checking Comparators with an Arbitrary Number of Inputs. [Citation Graph (0, 0)][DBLP]
   IEEE Trans. Computers, 1984, v:33, n:6, pp:546-550 [Journal]
   
10. David G. Furchtgott, John F. Meyer
    A Performability Solution Method for Degradable Nonrepairable Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:6, pp:550-554 [Journal]
    
11. John Paul Shen, F. Joel Ferguson
    The Design of Easily Tastabel VLSI Array Multipliers. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:6, pp:554-560 [Journal]
    
12. El Mostapha Aboulhamid, Eduard Cerny
    Built-In Testing of One-Dimensional Unilateral Iterative Arrays. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:6, pp:560-564 [Journal]
    
13. Paola Velardi, Ravishankar K. Iyer
    A Study of Software Failures and Recovery in the MVS Operating System. [Citation Graph (1, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:6, pp:564-568 [Journal]
    
14. Cauligi S. Raghavendra, Algirdas Avizienis, Milos D. Ercegovac
    Fault Tolerance in Binary Tree Architectures. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:6, pp:568-572 [Journal]
    
15. Hao Dong
    Modified Berger Codes for Detection of Unidirectional Errors. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:6, pp:572-575 [Journal]
    
16. Bella Bose, T. R. N. Rao
    Unidirectional Error Codes for Shift-Register Memories. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:6, pp:575-578 [Journal]
    
17. Eiji Fujiwara, Nobuo Mutoh, Kohji Matsuoka
    A Self-Testing Group-Parity Prediction Checker and Its Use for Built-In Testing. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:6, pp:578-583 [Journal]
    
18. Bella Bose, Der Jei Lin
    PLA Implementation of k-out-of-n Code TSC Checker. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Computers, 1984, v:33, n:6, pp:583-588 [Journal]