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Journals in DBLP
- Hideo Fujiwara, Kozo Kinoshita
A Design of Programmable Logic Arrays with Universal Tests. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 1981, v:30, n:11, pp:823-828 [Journal]
- Wilfried Daehn, Joachim Mucha
A Hardware Approach to Self-Testing of Large Programmable Logic Arrays. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 1981, v:30, n:11, pp:829-833 [Journal]
- R. Parthasarathy, Sudhakar M. Reddy
A Testable Design of Iterative Logic Arrays. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 1981, v:30, n:11, pp:833-841 [Journal]
- Thirumalai Sridhar, John P. Hayes
Design of Easily Testable Bit-Sliced Systems. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 1981, v:30, n:11, pp:842-854 [Journal]
- Vinod K. Agarwal, Andy S. F. Fung
Multiple Fault Testing of Large Circuits by Single Fault Test Sets. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 1981, v:30, n:11, pp:855-865 [Journal]
- Edward J. McCluskey, Saied Bozorgui-Nesbat
Design for Autonomous Test. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 1981, v:30, n:11, pp:866-875 [Journal]
- Jacob A. Abraham, Daniel Gajski
Design of Testable Structures Defined by Simple Loops. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 1981, v:30, n:11, pp:875-884 [Journal]
- Robert W. Priester, James B. Clary
New Measures of Testability and Test Complexity for Linear Analog Failure Analysis. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 1981, v:30, n:11, pp:884-888 [Journal]
- V. Visvanathan, Alberto L. Sangiovanni-Vincentelli
Diagnosability of Nonlinear Circuits and Systems - Part I: The dc Case. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 1981, v:30, n:11, pp:889-898 [Journal]
- Richard Saeks, Alberto L. Sangiovanni-Vincentelli, V. Visvanathan
Diagnosability of Nonlinear Circuits and Systems - Part II: Dynamical Systems. [Citation Graph (0, 0)][DBLP]
IEEE Trans. Computers, 1981, v:30, n:11, pp:899-904 [Journal]
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