Journals in DBLP
Dimiter R. Avresky , Barry W. Johnson , Fabrizio Lombardi Guest Editors' Introduction. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:97-99 [Journal ] David L. Oppenheimer , Aaron B. Brown , James Beck , Daniel Hettena , Jon Kuroda , Noah Treuhaft , David A. Patterson , Katherine A. Yelick ROC-1: Hardware Support for Recovery-Oriented Computing. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:100-107 [Journal ] Roy A. Maxion , Kymie M. C. Tan Anomaly Detection in Embedded Systems. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:108-120 [Journal ] Ann T. Tai , Kam S. Tso , Leon Alkalai , Savio N. Chau , William H. Sanders Low-Cost Error Containment and Recovery for Onboard Guarded Software Upgrading and Beyond. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:121-137 [Journal ] Jean Arlat , Jean-Charles Fabre , Manuel Rodríguez , Frédéric Salles Dependability of COTS Microkernel-Based Systems. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:138-163 [Journal ] Jie Xu , Brian Randell , Alexander B. Romanovsky , Robert J. Stroud , Avelino F. Zorzo , Ercument Canver , Friedrich W. von Henke Rigorous Development of an Embedded Fault-Tolerant System Based on Coordinated Atomic Actions. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:164-179 [Journal ] Nahmsuk Oh , Subhasish Mitra , Edward J. McCluskey ED4I: Error Detection by Diverse Data and Duplicated Instructions. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:180-199 [Journal ] Fabrizio Ferrandi , Franco Fummi , Donatella Sciuto Test Generation and Testability Alternatives Exploration of Critical Algorithms for Embedded Applications. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:200-215 [Journal ] David Lee , Mihalis Yannakakis Closed Partition Lattice and Machine Decomposition. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:216-228 [Journal ] Stanislaw J. Piestrak Design Method of a Class of Embedded Combinational Self-Testing Checkers for Two-Rail Codes. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:229-234 [Journal ] Andreas Steininger , Christoph Scherrer Identifying Efficient Combinations of Error Detection Mechanisms Based on Results of Fault Injection Experiments. [Citation Graph (0, 0)][DBLP ] IEEE Trans. Computers, 2002, v:51, n:2, pp:235-239 [Journal ]