Asim Smailagic Wearable Computers: A New Paradigm in Computer Systems and Their Applications. [Citation Graph (0, 0)][DBLP] IEEE Trans. Computers, 2003, v:52, n:8, pp:977-978 [Journal]
Dong Xiang, Yi Xu, Hideo Fujiwara Nonscan Design for Testability for Synchronous Sequential Circuits Based on Conflict Resolution. [Citation Graph (0, 0)][DBLP] IEEE Trans. Computers, 2003, v:52, n:8, pp:1063-1075 [Journal]
Anshuman Chandra, Krishnendu Chakrabarty Test Data Compression and Test Resource Partitioning for System-on-a-Chip Using Frequency-Directed Run-Length (FDR) Codes. [Citation Graph (0, 0)][DBLP] IEEE Trans. Computers, 2003, v:52, n:8, pp:1076-1088 [Journal]
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