Dennis R. Morgan Autocorrelation Function of Sequential M-Bit Words Taken from an N-Bit Shift Register (PN) Sequence. [Citation Graph (0, 0)][DBLP] IEEE Trans. Computers, 1980, v:29, n:5, pp:408-410 [Journal]
Jacob Savir Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection. [Citation Graph (0, 0)][DBLP] IEEE Trans. Computers, 1980, v:29, n:5, pp:410-416 [Journal]
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