Hyunwoo Cho, Gary D. Hachtel, Fabio Somenzi Redundancy identification/removal and test generation for sequential circuits using implicit state enumeration. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:7, pp:935-945 [Journal]
Tai-Tsung Ho A density-based greedy router. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:7, pp:974-981 [Journal]
Mahesh S. Sharma, Narain D. Arora OPTIMA: A nonlinear model parameter extraction program with statistical confidence region algorithms. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:7, pp:982-987 [Journal]
Denis Martin, Nicholas C. Rumin Delay prediction from resistance-capacitance models of general MOS circuits. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:7, pp:997-1003 [Journal]
Lean Peterson, Sven Marrisson The design and implementation of a concurrent circuit simulation program for multicomputers. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:7, pp:1004-1014 [Journal]
Irith Pomeranz, Sudhakar M. Reddy 3-weight pseudo-random test generation based on a deterministic test set for combinational and sequential circuits. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:7, pp:1050-1058 [Journal]
Kuo-En Chang Efficient algorithms of wiring channels with movable terminals. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:7, pp:1059-1063 [Journal]
Lori E. Lucke, Keshab K. Parhi Data-flow transformations for critical path time reduction in high-level DSP synthesis. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:7, pp:1063-1068 [Journal]