M. D. Giles, J. F. Gibbons Calculation of Channeling Effects During Ion Implantation Using the Boltzmann Transport Equation. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:362-368 [Journal]
A. M. Mazzone Monte Carlo Methods in Defects Migration -- Spontaneous Annealing of Damage Induced by Ion Implantation. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:369-373 [Journal]
J. Albers Monte Carlo Calculation of One- and Two-Dimensional Particle and Damage Distributions for Ion-Implanted Dopants in Silicon. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:374-383 [Journal]
Albert Seidl, Milos Svoboda Numerical Conformal Mapping for Treatment of Geometry Problems in Process Simulation. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:404-407 [Journal]
Hal R. Yeager, Robert W. Dutton An Approach to Solving Multiparticle Diffusion Exhibiting Nonlinear Stiff Coupling. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:408-420 [Journal]
Craig C. Douglas A Multilevel Solver for Boundary Value Problems. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:431-435 [Journal]
Steven E. Laux Techniques for Small-Signal Analysis of Semiconductor Devices. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:472-481 [Journal]
Joseph W. Jerome The Role of Semiconductor Device Diameter and Energy-Band Bending in Convergence of Picard Iteration for Gummel's Map. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:489-495 [Journal]
E. Palm, F. Van de Wiele Current Lines and Accurate Contact Current Evaluation in 2-D Numerical Simulation of Semiconductor Devices. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:496-503 [Journal]
H. S. Bennett, D. E. Fuoss Improved Physics for Simulating Submicron Bipolar Devices. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:513-519 [Journal]
Steven E. Laux, Bertrand M. Grossman A General Control-Volume Formulation for Modeling Impact Ionization in Semiconductor Transport. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:520-526 [Journal]
A. S. Shieh On the Solution of Coupled System of PDE by a Multigrid Method. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:527-530 [Journal]
C. Moglestue A Monte Carlo Particle Study of the Intrinsic Noise Figure in GaAs MESFET's. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:536-540 [Journal]
Jeffrey L. Gray, Mark S. Lundstrom A Numerical Solution of Poisson's Equation with Application to C-V Analysis of III-V Heterojunction Capacitors. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:546-553 [Journal]
R. I. Sokel, D. B. MacMillen Practical Integration of Process, Device, and Circuit Simulation. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:554-560 [Journal]
M.-D. D. Huang The Constant-Flow Patch Test -- A Unique Guideline for the Evaluation of Discretization Schemes for the Current Continuity Equations. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:583-608 [Journal]
Hong-June Park, Choong-Ki Kim An Empirical Model for the Threshold Voltage of Enhancement NMOSFET's. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:629-635 [Journal]
San-Chin Fang, Yannis P. Tsividis, Omar Wing Time- and Frequency-Domain Analysis of Linear Switched-Capacitor Networks Using State Charge Variables. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:651-661 [Journal]
Eduard Cerny, Jan Gecsei Simulation of MOS Circuits by Decision Diagrams. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1985, v:4, n:4, pp:685-693 [Journal]