Ben Mathew, Daniel G. Saab Combining multiple DFT schemes with test generation. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:6, pp:685-696 [Journal]
Catherine H. Gebotys A minimum-cost circulation approach to DSP address-code generation. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:6, pp:726-741 [Journal]
Chris C. N. Chu, Martin D. F. Wong A quadratic programming approach to simultaneous buffer insertion/sizing and wire sizing. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:6, pp:787-798 [Journal]
Sanghyeon Baeg, William A. Rogers A cost-effective design for testability: clock line control and test generation using selective clocking. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:6, pp:850-861 [Journal]