Ramesh Karri, Balakrishnan Iyer, Israel Koren Phantom redundancy: a register transfer level technique for gracefully degradable data path synthesis. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:8, pp:877-888 [Journal]
Kaustav Banerjee, Amit Mehrotra Analysis of on-chip inductance effects for distributed RLC interconnects. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:8, pp:904-915 [Journal]
Steven C. Chan, Kenneth L. Shepard, Dae-Jin Kim Static noise analysis for digital integrated circuits in partially depleted silicon-on-insulator technology. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:8, pp:916-927 [Journal]
Seongmoon Wang, Sandeep K. Gupta An automatic test pattern generator for minimizing switching activity during scan testing activity. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:8, pp:954-968 [Journal]