Jong-Yeol Lee, In-Cheol Park Timed compiled-code functional simulation of embedded software for performance analysis of SOC design. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:1, pp:1-14 [Journal]
David J. Walkey, Dritan Celo, Tom J. Smy A simplified model for the effect of interfinger metal on maximum temperature rise in a multifinger bipolar transistor. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:1, pp:15-25 [Journal]
Nikolay Rubanov SubIslands: the probabilistic match assignment algorithm for subcircuit recognition. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:1, pp:26-38 [Journal]
Irith Pomeranz, Sudhakar M. Reddy Test enrichment for path delay faults using multiple sets of target faults. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:1, pp:82-90 [Journal]
Chun-Yao Wang, Shing-Wu Tung, Jing-Yang Jou Automatic interconnection rectification for SoC design verification based on the port order fault model. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2003, v:22, n:1, pp:104-114 [Journal]
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP