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Sandeep Bhatia, Niraj K. Jha Synthesis for parallel scan: applications to partial scan and robust path-delay fault testability. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1996, v:15, n:2, pp:228-243 [Journal]
Y. G. Chen, James B. Kuo A unified triode/saturation model with an improved continuity in the output conductance suitable for CAD of VLSI circuits using deep sub-0.1 µm NMOS devices. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1996, v:15, n:2, pp:256-258 [Journal]