Journals in DBLP
Aiguo Xie , Peter A. Beerel Accelerating Markovian analysis of asynchronous systems using state compression. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:869-888 [Journal ] Arun N. Lokanathan , Jay B. Brockman A methodology for concurrent process-circuit optimization. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:889-902 [Journal ] Henrik Hulgaard , Poul Frederick Williams , Henrik Reif Andersen Equivalence checking of combinational circuits using Boolean expression diagrams. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:903-917 [Journal ] Manish Pandey , Randal E. Bryant Exploiting symmetry when verifying transistor-level circuits by symbolic trajectory evaluation. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:918-935 [Journal ] Sheetanshu L. Pandey , Kothanda Umamageswaran , Philip A. Wilsey VHDL semantics and validating transformations. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:936-955 [Journal ] Sofiène Tahar , Xiaoyu Song , Eduard Cerny , Zijian Zhou , Michel Langevin , Otmane Aït Mohamed Modeling and formal verification of the Fairisle ATM switch fabricusing MDGs. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:956-972 [Journal ] Radu Marculescu , Diana Marculescu , Massoud Pedram Sequence compaction for power estimation: theory and practice. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:973-993 [Journal ] Youxin Gao , Martin D. F. Wong Optimal shape function for a bidirectional wire under Elmore delay model. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:994-999 [Journal ] Christoph Maier , Markus Emmenegger , Stefano Taschini , Henry Baltes , Jan G. Korvink Equivalent circuit model of resistive IC sensors derived with the box integration method. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:1000-1013 [Journal ] Chung-Ping Chen , Chris C. N. Chu , Martin D. F. Wong Fast and exact simultaneous gate and wire sizing by Lagrangian relaxation. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:1014-1025 [Journal ] Giri Devarayanadurg , Mani Soma , Prashant Goteti , Sam D. Huynh Test set selection for structural faults in analog IC's. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:1026-1039 [Journal ] Irith Pomeranz , Sudhakar M. Reddy , Ruifeng Guo Static test compaction for synchronous sequential circuits based on vector restoration. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:1040-1049 [Journal ] Spyros Tragoudas , Dimitrios Karayiannis A fast nonenumerative automatic test pattern generator for pathdelay faults. [Citation Graph (0, 0)][DBLP ] IEEE Trans. on CAD of Integrated Circuits and Systems, 1999, v:18, n:7, pp:1050-1057 [Journal ]