Kwang-Ting Cheng Redundancy removal for sequential circuits without reset states. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:1, pp:13-24 [Journal]
Shiuh-Wuu Lee A proposed method for determining a MOSFET gate electrode's bottom dimension and the on-state fringing capacitance. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:1, pp:96-101 [Journal]
Benjamin R. Epstein, Martin H. Czigler, Steven R. Miller Fault detection and classification in linear integrated circuits: an application of discrimination analysis and hypothesis testing. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:1, pp:102-113 [Journal]
Niraj K. Jha, Abha Ahuja Easily testable nonrestoring and restoring gate-level cellular array dividers. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:1, pp:114-123 [Journal]
Pinaki Mazumder, Jih-Shyr Yih A new built-in self-repair approach to VLSI memory yield enhancement by using neural-type circuits. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:1, pp:124-136 [Journal]
Wen-Ben Jone, Patrick H. Madden Multiple fault testing using minimal single fault test set for fanout-free circuits. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:1, pp:149-157 [Journal]
Alan Rotman, Ran Ginosar Control unit synthesis from a high-level language. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:1, pp:162-167 [Journal]
Kyunrak Chong, Sartaj Sahni Minimizing total wire length by flipping modules. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 1993, v:12, n:1, pp:167-175 [Journal]