Jiang Hu, Sachin S. Sapatnekar A timing-constrained simultaneous global routing algorithm. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:9, pp:1025-1036 [Journal]
Irith Pomeranz On the use of random limited-scan to improve at-speed randompattern testing of scan circuits. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:9, pp:1068-1076 [Journal]
Kaijie Wu, Ramesh Karri Algorithm level recomputing using allocation diversity: a registertransfer level approach to time redundancy-based concurrent errordetection. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:9, pp:1077-1087 [Journal]
Vikram Iyengar, Krishnendu Chakrabarty System-on-a-chip test scheduling with precedence relationships, preemption, and power constraints. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:9, pp:1088-1094 [Journal]
Mutsumi Kimura, Satoshi Inoue, Tatsuya Shimoda Table look-up model of thin-film transistors for circuit simulationusing spline interpolation with transformation by y=x+log(x). [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:9, pp:1101-1104 [Journal]
Dong Xiang, Hideo Fujiwara Handling the pin overhead problem of DFTs for high-quality and at-speed tests. [Citation Graph (0, 0)][DBLP] IEEE Trans. on CAD of Integrated Circuits and Systems, 2002, v:21, n:9, pp:1105-1113 [Journal]
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP