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Journals in DBLP
- Claudio Passerone, Claudio Sansoè, Luciano Lavagno, Patrick C. McGeer, Jonathan Martin, Roberto Passerone, Alberto L. Sangiovanni-Vincentelli
Modeling reactive systems in Java. [Citation Graph (0, 0)][DBLP] ACM Trans. Design Autom. Electr. Syst., 1998, v:3, n:4, pp:515-523 [Journal]
- Li-C. Wang, Magdy S. Abadir, Jing Zeng
On measuring the effectiveness of various design validation approaches for PowerPC microprocessor embedded arrays. [Citation Graph (0, 0)][DBLP] ACM Trans. Design Autom. Electr. Syst., 1998, v:3, n:4, pp:524-532 [Journal]
- Ali Dasdan, Dinesh Ramanathan, Rajesh K. Gupta
A timing-driven design and validation methodology for embedded real-time systems. [Citation Graph (0, 0)][DBLP] ACM Trans. Design Autom. Electr. Syst., 1998, v:3, n:4, pp:533-553 [Journal]
- Sreeranga P. Rajan, Masahiro Fujita, K. Yuan, Mike Tien-Chien Lee
ATM switch design by high-level modeling, formal verification and high-level synthesi. [Citation Graph (0, 0)][DBLP] ACM Trans. Design Autom. Electr. Syst., 1998, v:3, n:4, pp:554-562 [Journal]
- James K. Huggins, David Van Campenhout
Specification and verification of pipelining in the ARM2 RISC microprocessor. [Citation Graph (0, 0)][DBLP] ACM Trans. Design Autom. Electr. Syst., 1998, v:3, n:4, pp:563-580 [Journal]
- David Van Campenhout, Hussain Al-Asaad, John P. Hayes, Trevor N. Mudge, Richard B. Brown
High-level design verification of microprocessors via error modeling. [Citation Graph (0, 0)][DBLP] ACM Trans. Design Autom. Electr. Syst., 1998, v:3, n:4, pp:581-599 [Journal]
- Gagan Hasteer, Anmol Mathur, Prithviraj Banerjee
Efficient equivalence checking of multi-phase designs using phase abstraction and retiming. [Citation Graph (0, 0)][DBLP] ACM Trans. Design Autom. Electr. Syst., 1998, v:3, n:4, pp:600-625 [Journal]
- Alfredo Benso, Paolo Prinetto, Maurizio Rebaudengo, Matteo Sonza Reorda
EXFI: a low-cost fault injection system for embedded microprocessor-based boards. [Citation Graph (0, 0)][DBLP] ACM Trans. Design Autom. Electr. Syst., 1998, v:3, n:4, pp:626-634 [Journal]
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