Journals in DBLP

ACM Trans. Design Autom. Electr. Syst.
2005, volume: 10, number: 4

1. Ian G. Harris
   Introduction. [Citation Graph (0, 0)][DBLP]
   ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:4, pp:587-588 [Journal]
   
2. Syed Suhaib, Deepak Mathaikutty, Sandeep K. Shukla, David Berner
   XFM: An incremental methodology for developing formal models. [Citation Graph (0, 0)][DBLP]
   ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:4, pp:589-609 [Journal]
   
3. Masahiro Fujita
   Equivalence checking between behavioral and RTL descriptions with virtual controllers and datapaths. [Citation Graph (0, 0)][DBLP]
   ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:4, pp:610-626 [Journal]
   
4. Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Chih-Chan Lin
   Using 2-domain partitioned OBDD data structure in an enhanced symbolic simulator. [Citation Graph (0, 0)][DBLP]
   ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:4, pp:627-650 [Journal]
   
5. Jason T. Higgins, Mark Aagaard
   Simplifying the design and automating the verification of pipelines with structural hazards. [Citation Graph (0, 0)][DBLP]
   ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:4, pp:651-672 [Journal]
   
6. Saeed Shamshiri, Hadi Esmaeilzadeh, Zainalabedin Navabi
   Instruction-level test methodology for CPU core self-testing. [Citation Graph (0, 0)][DBLP]
   ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:4, pp:673-689 [Journal]
   
7. Ahmad A. Al-Yamani, Edward J. McCluskey
   Test chip experimental results on high-level structural test. [Citation Graph (0, 0)][DBLP]
   ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:4, pp:690-701 [Journal]
   
8. Calin Ciordas, Twan Basten, Andrei Radulescu, Kees Goossens, Jef L. van Meerbergen
   An event-based monitoring service for networks on chip. [Citation Graph (0, 0)][DBLP]
   ACM Trans. Design Autom. Electr. Syst., 2005, v:10, n:4, pp:702-723 [Journal]