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Journals in DBLP

IEEE Trans. Software Eng.
1975, volume: 1, number: 2

  1. Albert Endres
    An Analysis of Errors and Their Causes in System Programs. [Citation Graph (1, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:140-149 [Journal]
  2. Raymond J. Rubey, Joseph A. Dana, Peter W. Biché
    Quantitative Aspects of Software Validation. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:150-155 [Journal]
  3. John B. Goodenough, Susan L. Gerhart
    Toward a Theory of Test Data Selection. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:156-173 [Journal]
  4. L. M. Culpepper
    A System for Reliable Engineering Software. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:174-178 [Journal]
  5. John D. Gannon, James J. Horning
    Language Design for Programming Reliability. [Citation Graph (2, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:179-191 [Journal]
  6. Niklaus Wirth
    An Assessment of the Programming Language Pascal. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:192-198 [Journal]
  7. Per Brinch Hansen
    The Programming Language Concurrent Pascal. [Citation Graph (5, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:199-207 [Journal]
  8. Charles M. Geschke, James G. Mitchell
    On the Problem of Uniform References to Data Structures. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:207-219 [Journal]
  9. Brian Randell
    System Structure for Software Fault Tolerance. [Citation Graph (13, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:221-232 [Journal]
  10. William A. Wulf
    Reliable Hardware/Software Architecture. [Citation Graph (1, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:233-240 [Journal]
  11. F. Terry Baker
    Structured Programming in a Production Programming Environment. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:241-252 [Journal]
  12. William C. Lynch, John W. Langner, Marvin S. Schwartz
    Reliability Experience with Chi/OS. [Citation Graph (0, 0)][DBLP]
    IEEE Trans. Software Eng., 1975, v:1, n:2, pp:253-257 [Journal]
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