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Journals in DBLP

Microelectronics Reliability
2001, volume: 41, number: 5

  1. Elyse Rosenbaum, Jie Wu
    Trap generation and breakdown processes in very thin gate oxides. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:625-632 [Journal]
  2. Petteri Palm, Jarmo Määttänen, Aulis Tuominen, Eero Ristolainen
    Reliability of 80 mum pitch flip chip attachment on flex. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:633-638 [Journal]
  3. Shatil Haque, Guo-Quan Lu
    Effects of device passivation materials on solderable metallization of IGBTs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:639-647 [Journal]
  4. Everett E. King, Ronald C. Lacoe, Janet Wang-Ratkovic
    Influence of the lightly doped drain resistance on the worst-case hot-carrier stress condition for NMOS devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:649-660 [Journal]
  5. Jaakko Lenkkeri, Tuomo Jaakola
    Rapid power cycling of flip-chip and CSP components on ceramic substrates. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:661-668 [Journal]
  6. Andrzej Dziedzic, Leszek J. Golonka, Jaroslaw Kita, Heiko Thust, Karl-Heinz Drue, Reinhard Bauer, Lars Rebenklau, Klaus-Jürgen Wolter
    Electrical and stability properties and ultrasonic microscope characterisation of low temperature co-fired ceramics resistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:669-676 [Journal]
  7. S. C. Hung, P. J. Zheng, S. H. Ho, S. C. Lee, H. N. Chen, J. D. Wu
    Board level reliability of PBGA using flex substrate. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:677-687 [Journal]
  8. Yung-Huei Lee, Tom Linton, Ken Wu, Neal Mielke
    Effect of trench edge on pMOSFET reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:689-696 [Journal]
  9. Takayuki Yamada, Masaru Moriwaki, Yoshinao Harada, Shinji Fujii, Koji Eriguchi
    Effects of the sputtering deposition process of metal gate electrode on the gate dielectric characteristics. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:697-704 [Journal]
  10. Greg Hotchkiss, Gonzalo Amador, Darvin Edwards, Paul Hundt, Les Stark, Roger Stierman, Gail Heinen
    Wafer level packaging of a tape flip-chip chip scale packages. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:705-713 [Journal]
  11. Harry K. Charles Jr.
    Tradeoffs in multichip module yield and cost with known good die probability and repair. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:715-733 [Journal]
  12. Frank Stepniak
    Conversion of the under bump metallurgy into intermetallics: the impact on flip chip reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:735-744 [Journal]
  13. Kin P. Cheung
    Impact of ESD protection device trigger transient on the reliability of ultra-thin gate oxide. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:745-749 [Journal]
  14. Terence B. Hook, David Harmon, Chuan Lin
    Plasma process-induced damage on thick (6.8 nm) and thin (3.5 nm) gate oxide: parametric shifts, hot-carrier response, and dielectric integrity degradation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:751-765 [Journal]
  15. D. Manic, J. Petr, R. S. Popovic
    Die stress drift measurement in IC plastic packages using the piezo-Hall effect. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:767-771 [Journal]
  16. O. Mrooz, A. Kovalski, J. Pogorzelska, O. Shpotyuk, M. Vakiv, Bohdan S. Butkiewicz, J. Maciak
    Thermoelectrical degradation processes in NTC thermistors for in-rush current protection of electronic circuits. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:5, pp:773-777 [Journal]
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