The SCEAS System
Navigation Menu

Journals in DBLP

Microelectronics Reliability
2001, volume: 41, number: 6

  1. Brian K. Jones
    In the memory of Yisong Dai. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:779- [Journal]
  2. Stephen O'Reilly, Maeve Duffy, Thomas Ott, Terence O'Donnell, Paul McCloskey, S. Cian O'Mathuna
    Characterisation of embedded filters in advanced printed wiring boards. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:781-788 [Journal]
  3. Roland Sorge, Bernd Heinemann
    Recombination current measurements in the space charge region of MOS field-induced pn junctions. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:789-795 [Journal]
  4. Mark Zwolinski
    A technique for transparent fault injection and simulation in VHDL. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:797-804 [Journal]
  5. Michael J. Dion
    Improved understanding of metal ion reservoirs within barrier-metal systems. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:805-814 [Journal]
  6. Michael Schenkel, Paul Pfäffli, Wolfgang Wilkening, D. Aemmer, Wolfgang Fichtner
    Substrate potential shift due to parasitic minority carrier injection in smart-power ICs: measurements and full-chip 3D device simulation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:815-822 [Journal]
  7. Mirko Jakovljevic, Peter A. Fotiu, Zeljko Mrcarica, Vanco B. Litovski, Helmut Detter
    Electro-thermal simulation of microsystems with mixed abstraction modelling. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:823-835 [Journal]
  8. Slobodan Mijalkovic
    A new finite element approach to stress analysis in microfabrication technology. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:837-845 [Journal]
  9. M. J. Martín-Martínez, S. Pérez, D. Pardo, T. González
    High injection effects on noise characteristics of Si BJTs and SiGe HBTs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:847-854 [Journal]
  10. S. Haendler, J. Jomaah, G. Ghibaudo, F. Balestra
    Improved analysis of low frequency noise in dynamic threshold MOS/SOI transistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:855-860 [Journal]
  11. Michael Scheffler, Didier Cottet, Gerhard Tröster
    A simplified yield modeling method for design rule trade-off in interconnection substrates. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:861-869 [Journal]
  12. G. Golan, A. Axelevitch, E. Rabinovitch
    Effects of electron beam generated in vacuum photo-thermal processing on metal-silicon contacts. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:871-879 [Journal]
  13. Martin Sandén, B. Gunnar Malm, Jan V. Grahn, Mikael Östling
    Lateral base design rules for optimized low-frequency noise of differentially grown SiGe heterojunction bipolar transistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:881-886 [Journal]
  14. J. Barton, G. McCarthy, R. Doyle, K. Delaney, Enric Cabruja, M. Lozano, A. Collado, J. Santander
    Reliability evaluation of a silicon-on-silicon MCM-D package. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:887-899 [Journal]
  15. F. N. Masana
    A new approach to the dynamic thermal modelling of semiconductor packages. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:901-912 [Journal]
  16. W. Y. Ho, C. Surya
    Study of light-induced annealing effects in a-Si: H thin films. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:913-917 [Journal]
  17. Yisong Dai
    Generation-recombination noise in bipolar transistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:919-925 [Journal]
  18. Lingfeng Mao, Changhua Tan, Mingzhen Xu
    The effect of image potential on electron transmission and electric current in the direct tunneling regime of ultra-thin MOS structures. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2001, v:41, n:6, pp:927-931 [Journal]
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002