Journals in DBLP
Alexander Ambatiello , Josef Deichler Low and high temperature device reliability investigations of buried p-channel MOSFETs of a 0.17 mum technology. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1915-1921 [Journal ] Gennadi Bersuker , Yongjoo Jeon , Howard R. Huff Degradation of thin oxides during electrical stress. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1923-1931 [Journal ] M. Da Rold , E. Simoen , S. Mertens , M. Schaekers , G. Badenes , S. Decoutere Impact of gate oxide nitridation process on 1/f noise in 0.18 mum CMOS. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1933-1938 [Journal ] Zhenqiu Ning , Yuri Sneyders , Wim Vanderbauwhede , Renaud Gillon , Marnix Tack , Paul Raes A compact test structure for characterisation of leakage currents in sub-micron CMOS technologies. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1939-1945 [Journal ] Z. Chobola Noise as a tool for non-destructive testing of single-crystal silicon solar cells. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1947-1952 [Journal ] Jin He , Xing Zhang , Ru Huang , Yangyuan Wang Extraction of the lateral distribution of interface traps in MOSFETs by a novel combined gated-diode technique. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1953-1957 [Journal ] B. P. Yan , Y. F. Yang , C. C. Hsu , H. B. Lo , E. S. Yang A reliability comparison of InGaP/GaAs HBTs with and without passivation ledge. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1959-1963 [Journal ] D. Fedasyuk , E. Levus , D. Petrov Flip-chip structure transient thermal model. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1965-1970 [Journal ] Piotr Dziurdzia , Andrzej Kos Monitoring of power dissipated in microelectronic structures. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1971-1978 [Journal ] Xingsheng Liu , Shuangyan Xu , Guo-Quan Lu , David A. Dillard Stacked solder bumping technology for improved solder joint reliability. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1979-1992 [Journal ] P. L. Tu , Y. C. Chan , K. C. Hung Reliability of microBGA assembly using no-flow underfill. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:1993-2000 [Journal ] Shyh-Ming Chang , Jwo-Huei Jou , Adam Hsieh , Tai-Hong Chen , Ching-Yun Chang , Yung-Hao Wang , Chun-Ming Huang Characteristic study of anisotropic-conductive film for chip-on-film packaging. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:2001-2009 [Journal ] W. D. Zhuang , P. C. Chang , F. Y. Chou , R. K. Shiue Effect of solder creep on the reliability of large area die attachment. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:2011-2021 [Journal ] Mykola Blyzniuk , Irena Kazymyra , Wieslaw Kuzmicz , Witold A. Pleskacz , Jaan Raik , Raimund Ubar Probabilistic analysis of CMOS physical defects in VLSI circuits for test coverage improvement. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:2023-2040 [Journal ] S. Dordevic , P. Petkovic A hierarchical approach to large circuit symbolic simulation. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:2041-2049 [Journal ] Robert I. Damper , Richard L. B. French , Tom W. Scutt The Hi-NOON neural simulator and its applications. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:2051-2065 [Journal ] Bharatwaj Ramakrishnan , Peter Sandborn , Michael G. Pecht Process capability indices and product reliability. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:2067-2070 [Journal ] M. C. Poon , Y. Gao , T. C. W. Kok , A. M. Myasnikov , Hei Wong SIMS study of silicon oxynitride prepared by oxidation of silicon-rich silicon nitride layer. [Citation Graph (0, 0)][DBLP ] Microelectronics Reliability, 2001, v:41, n:12, pp:2071-2074 [Journal ]