The SCEAS System
Navigation Menu

Journals in DBLP

Microelectronics Reliability
2002, volume: 42, number: 4-5

  1. Ninoslav Stojadinovic, Michael G. Pecht
    Editorial. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:463- [Journal]
  2. Hiroshi Iwai, Shun'ichiro Ohmi
    Silicon integrated circuit technology from past to future. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:465-491 [Journal]
  3. Eiji Takeda, Eiichi Murakami, Kazuyoshi Torii, Yutaka Okuyama, Eishi Ebe, Kenji Hinode, Shin'ichiro Kimura
    Reliability issues of silicon LSIs facing 100-nm technology node. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:493-506 [Journal]
  4. Gilbert De Mey
    A thermodynamic limit for digital electronics. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:507-510 [Journal]
  5. S. Nakajima, S. Nakamura, K. Kuji, T. Ueki, T. Ajioka, T. Sakai
    Construction of a cost-effective failure analysis service network--microelectronic failure analysis service in Japan. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:511-521 [Journal]
  6. D. M. Fleetwood
    Effects of hydrogen transport and reactions on microelectronics radiation response and reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:523-541 [Journal]
  7. Kinam Kim, Gi-Tae Jeong, Chan-Woong Chun, Sam-Jin Hwang
    DRAM reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:543-553 [Journal]
  8. Ben Kaczer, Robin Degraeve, M. Rasras, A. De Keersgieter, K. Van de Mieroop, Guido Groeseneken
    Analysis and modeling of a digital CMOS circuit operation and reliability after gate oxide breakdown: a case study. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:555-564 [Journal]
  9. M. K. Radhakrishnan, K. L. Pey, C. H. Tung, W. H. Lin
    Physical analysis of hard and soft breakdown failures in ultrathin gate oxides. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:565-571 [Journal]
  10. G. Ghibaudo, T. Boutchacha
    Electrical noise and RTS fluctuations in advanced CMOS devices. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:573-582 [Journal]
  11. Adelmo Ortiz-Conde, F. J. García Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue
    A review of recent MOSFET threshold voltage extraction methods. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:583-596 [Journal]
  12. Hei Wong, V. A. Gritsenko
    Defects in silicon oxynitride gate dielectric films. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:597-605 [Journal]
  13. Masazumi Amagai
    Mechanical reliability in electronic packaging. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:607-627 [Journal]
  14. V. Székely
    Enhancing reliability with thermal transient testing. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:629-640 [Journal]
  15. Dawn A. Thomas, Ken Ayers, Michael G. Pecht
    The "trouble not identified" phenomenon in automotive electronics. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:641-651 [Journal]
  16. Mauro Ciappa
    Selected failure mechanisms of modern power modules. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:653-667 [Journal]
  17. Ninoslav Stojadinovic, I. Manic, S. Djoric-Veljkovic, V. Davidovic, S. Golubovic, S. Dimitrijev
    Effects of high electric field and elevated-temperature bias stressing on radiation response in power VDMOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:669-677 [Journal]
  18. Mitsuo Fukuda
    Optical semiconductor device reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:679-683 [Journal]
  19. Gaudenzio Meneghesso, Enrico Zanoni
    Failure modes and mechanisms of InP-based and metamorphic high electron mobility transistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:685-708 [Journal]
  20. Andrzej Dziedzic
    Electrical and structural investigations in reliability characterisation of modern passives and passive integrated components. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:709-719 [Journal]
  21. Chun-Yen Chang, Jiong-Guang Su, Shyh-Chyi Wong, Tiao-Yuan Huang, Yuan-Chen Sun
    RF CMOS technology for MMIC. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:721-733 [Journal]
  22. Arokia Nathan, Byung-kyu Park, Qinghua Ma, Andrei Sazonov, John A. Rowlands
    Amorphous silicon technology for large area digital X-ray and optical imaging. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:735-746 [Journal]
  23. N. Tosic Golo, Fred G. Kuper, Ton J. Mouthaan
    Zapping thin film transistors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:747-765 [Journal]
  24. C. F. Luk, Y. C. Chan, K. C. Hung
    Application of adhesive bonding techniques in hard disk drive head assembly. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:767-777 [Journal]
  25. B. K. Jones
    Logarithmic distributions in reliability analysis. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:779-786 [Journal]
  26. Juin J. Liou, Qiang Zhang, John McMacken, J. Ross Thomson, Kevin Stiles, Paul Layman
    Statistical modeling of MOS devices for parametric yield prediction. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:787-795 [Journal]
  27. V. S. Pershenkov, S. V. Avdeev, A. S. Tsimbalov, M. N. Levin, V. V. Belyakov, D. V. Ivashin, A. Y. Slesarev, A. Y. Bashin, G. I. Zebrev, V. N. Ulimov
    Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:4-5, pp:797-804 [Journal]
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
System created by asidirop@csd.auth.gr [http://users.auth.gr/~asidirop/] © 2002
for Data Engineering Laboratory, Department of Informatics, Aristotle University © 2002