Journals in DBLP

Microelectronics Reliability
2002, volume: 42, number: 3

1. Guenther Benstetter, Michael W. Ruprecht, Douglas B. Hunt
   A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:3, pp:307-316 [Journal]
   
2. Hei Wong
   Recent developments in silicon optoelectronic devices. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:3, pp:317-326 [Journal]
   
3. Domenico Caputo, Fernanda Irrera
   Investigation and modeling of stressed thermal oxides. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:3, pp:327-333 [Journal]
   
4. Fen Chen, Rolf-Peter Vollertsen, Baozhen Li, Dave Harmon, Wing L. Lai
   A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO₂ and nitride-oxide dielectrics. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:3, pp:335-341 [Journal]
   
5. Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, F. J. García Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, C. S. Ho
   Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:3, pp:343-347 [Journal]
   
6. Yongseok Ahn, Sanghyun Lee, Gwanhyeob Koh, Taeyoung Chung, Kinam Kim
   The abnormality in gate oxide failure induced by stress-enhanced diffusion of polycrystalline silicon. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:3, pp:349-354 [Journal]
   
7. Yiqi Zhuang, Lei Du
   1/f noise as a reliability indicator for subsurface Zener diodes. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:3, pp:355-360 [Journal]
   
8. A. Caddemi, N. Donato
   Temperature-dependent noise characterization and modeling of on-wafer microwave transistors. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:3, pp:361-366 [Journal]
   
9. De-Shin Liu, Chin-Yu Ni
   A thermo-mechanical study on the electrical resistance of aluminum wire conductors. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2002, v:42, n:3, pp:367-374 [Journal]
   
10. T. Y. Lin, W. S. Leong, K. H. Chua, R. Oh, Y. Miao, J. S. Pan, J. W. Chai
    The impact of copper contamination on the quality of the second wire bonding process using X-ray photoelectron spectroscopy method. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:375-380 [Journal]
    
11. C. F. Luk, Y. C. Chan, K. C. Hung
    Development of gold to gold interconnection flip chip bonding for chip on suspension assemblies. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:381-389 [Journal]
    
12. Joachim Kloeser, Paradiso Coskina, Rolf Aschenbrenner, Herbert Reichl
    Bump formation for flip chip and CSP by solder paste printing. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:391-398 [Journal]
    
13. T. Alander, S. Nurmi, P. Heino, Eero Ristolainen
    Impact of component placement in solder joint reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:399-406 [Journal]
    
14. J. D. Wu, S. H. Ho, C. Y. Huang, C. C. Liao, P. J. Zheng, S. C. Hung
    Board level reliability of a stacked CSP subjected to cyclic bending. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:407-416 [Journal]
    
15. Didier Cottet, Michael Scheffler, Gerhard Tröster
    A novel, zone based process monitoring method for low cost MCM-D substrates manufactured on large area panels. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:417-426 [Journal]
    
16. P. Grybos, W. Dabrowski, P. Hottowy, R. Szczygiel, K. Swientek, P. Wiacek
    Multichannel mixed-mode IC for digital readout of silicon strip detectors. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:427-436 [Journal]
    
17. Asad A. Ismaeel, R. Bhatnagar, Rajan Mathew
    On-line testable data path synthesis for minimizing testing time. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:437-453 [Journal]
    
18. S. Chakraborty, P. T. Lai, Paul C. K. Kwok
    MOS characteristics of NO-grown oxynitrides on n-type 6H-SiC. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:455-458 [Journal]
    
19. F. Saigné, Olivier Quittard, Laurent Dusseau, F. Joffre, C. Oudéa, J. Fesquet, Jean Gasiot
    Prediction of long-term thermal behavior of an irradiated SRAM based on isochronal annealing measurements. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2002, v:42, n:3, pp:459-461 [Journal]