Journals in DBLP

Microelectronics Reliability
2003, volume: 43, number: 2

1. H. E. Aldrete-Vidrio, J. L. del Valle, J. Santana-Corte
   A TCAD comparative study of power rectifiers: modified P-i-N vs. modified mosaic contact P-i-N diode. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:2, pp:181-188 [Journal]
   
2. Magali Estrada, A. Afzalian, D. Flandre, Antonio Cerdeira, H. Baez, A. de Lucca
   FD MOS SOI circuit to enhance the ratio of illuminated to dark current of a co-integrated a-Si: H photodiode. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:2, pp:189-193 [Journal]
   
3. R. Murphy-Arteaga, J. Huerta-Chua, Alejandro Díaz-Sánchez, A. Torres-Jécome, W. Calleja-Arriaga, M. Landa-Vázquez
   Fabrication, characterisation and modelling of integrated on-silicon inductors. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:2, pp:195-201 [Journal]
   
4. Javier Lemus-López, Alejandro Díaz-Sánchez, Jaime Ramírez-Angulo
   An analog median filter with fuzzy adaptation. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:2, pp:203-207 [Journal]
   
5. D. Lopes de Oliveira, M. Strum, W. J. Chau, W. C. Cunha
   Miriã: a CAD tool to synthesize multi-burst controllers for heterogeneous systems. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:2, pp:209-215 [Journal]
   
6. D. Torres, A. Redondo, M. E. Guzmán
   MSOH processor for STM-0/STS-1 to STM-4/STS-12: component of a SDH/SONET library. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:2, pp:217-223 [Journal]
   
7. Sima Dimitrijev, Philippe Jamet
   Advances in SiC power MOSFET technology. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:2, pp:225-233 [Journal]
   
8. M. Pecovska-Gjorgjevich, N. Novkovski, E. Atanassova
   Electrical properties of thin RF sputtered Ta₂O₅ films after constant current stress. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:2, pp:235-241 [Journal]
   
9. François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra
   Low frequency noise in 0.12 mum partially and fully depleted SOI technology. [Citation Graph (0, 0)][DBLP]
   Microelectronics Reliability, 2003, v:43, n:2, pp:243-248 [Journal]
   
10. Paul Isaac Hagouel
    Blazed diffraction gratings fabricated using X-ray lithography: fabrication, modeling and simulation. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:249-258 [Journal]
    
11. K. S. Kim, S. H. Huh, K. Suganuma
    Effects of fourth alloying additive on microstructures and tensile properties of Sn-Ag-Cu alloy and joints with Cu. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:259-267 [Journal]
    
12. J. D. Wu, C. Y. Huang, C. C. Liao
    Fracture strength characterization and failure analysis of silicon dies. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:269-277 [Journal]
    
13. C. W. Tan, Y. C. Chan, N. H. Yeung
    Effect of autoclave test on anisotropic conductive joints. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:279-285 [Journal]
    
14. Ajit R. Dhamdhere, Ajay P. Malshe, William F. Schmidt, William D. Brown
    Investigation of reliability issues in high power laser diode bar packages. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:287-295 [Journal]
    
15. Paiboon Tangyunyong
    Thermal modeling of localized laser heating in multi-level interconnects. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:297-305 [Journal]
    
16. Bart Vandevelde, Dominiek Degryse, Eric Beyne, Eric Roose, Dorina Corlatan, Guido Swaelen, Geert Willems, Filip Christiaens, Alcatel Bell, Dirk Vandepitte
    Modified micro-macro thermo-mechanical modelling of ceramic ball grid array packages. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:307-318 [Journal]
    
17. Sasa A. Jankovic, Dejan M. Maksimovic
    Power saving modes in modern microcontroller design, diagnostics and reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:319-326 [Journal]
    
18. M. M. Shahidul Hassan
    Base transit time of an epitaxial n⁺pn^-n⁺ bipolar transistor considering Kirk effect. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:327-332 [Journal]
    
19. Sadegh Abbasian, Ebrahim Farjah
    A new drain current model for short-channel MOSFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:333-338 [Journal]
    
20. Keiji Takagi
    A study on 1/f noise spectrum generation in nonlinear transmission media and biomedical systems. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:2, pp:339-342 [Journal]