Frank Gao High reliability in PHEMT MMICs with dual-etch-stop AlAs layers for high-speed RF switch applications. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:6, pp:829-837 [Journal]
Charles S. Whitman Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:6, pp:859-864 [Journal]
R.-P. Vollertsen Thin dielectric reliability assessment for DRAM technology with deep trench storage node. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:6, pp:865-878 [Journal]
W. L. Pearn, Ming-Hung Shu Manufacturing capability control for multiple power-distribution switch processes based on modified Cpk MPPAC. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:6, pp:963-975 [Journal]
Takeshi Yanagisawa, Takeshi Kojima Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations. [Citation Graph (0, 0)][DBLP] Microelectronics Reliability, 2003, v:43, n:6, pp:977-980 [Journal]