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Microelectronics Reliability
2003, volume: 43, number: 6

  1. Wallace T. Anderson, Roberto Menozzi
    Editorial. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:821- [Journal]
  2. Hyungtak Kim, Alexei Vertiatchikh, Richard M. Thompson, Vinayak Tilak, Thomas R. Prunty, James R. Shealy, Lester F. Eastman
    Hot electron induced degradation of undoped AlGaN/GaN HFETs. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:823-827 [Journal]
  3. Frank Gao
    High reliability in PHEMT MMICs with dual-etch-stop AlAs layers for high-speed RF switch applications. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:829-837 [Journal]
  4. F. Brunner, A. Braun, P. Kurpas, J. Schneider, J. Würfl, M. Weyers
    Investigation of short-term current gain stability of GaInP/GaAs-HBTs grown by MOVPE. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:839-844 [Journal]
  5. William J. Rowe, Bruce M. Paine, Adele E. Schmitz, Robert H. Walden, Michael J. Delaney
    Reliability of 100 nm silicon nitride capacitors in an InP HEMT MMIC process. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:845-851 [Journal]
  6. Bruce M. Paine, Ami P. Shah, Thomas Rust
    The effects of ternary alloys on thermal resistances of HBTs, HEMTs, and laser diodes. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:853-858 [Journal]
  7. Charles S. Whitman
    Accelerated life test calculations using the method of maximum likelihood: an improvement over least squares. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:859-864 [Journal]
  8. R.-P. Vollertsen
    Thin dielectric reliability assessment for DRAM technology with deep trench storage node. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:865-878 [Journal]
  9. John J. H. Reche, Deok-Hoon Kim
    Wafer level packaging having bump-on-polymer structure. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:879-894 [Journal]
  10. J. C. Tinoco, Magali Estrada, G. Romero
    Room temperature plasma oxidation mechanism to obtain ultrathin silicon oxide and titanium oxide layers. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:895-903 [Journal]
  11. I. Stanimirovic, Milan Jevtic, Z. Stanimirovic
    High-voltage pulse stressing of thick-film resistors and noise. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:905-911 [Journal]
  12. Hong Meng Ho, Wai Lam, Serguei Stoukatch, Petar Ratchev, Charles J. Vath, Eric Beyne
    Direct gold and copper wires bonding on copper. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:913-923 [Journal]
  13. Po-Jen Zheng, J. Z. Lee, K. H. Liu, J. D. Wu, S. C. Hung
    Solder joint reliability of TFBGA assemblies with fresh and reworked solder balls. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:925-934 [Journal]
  14. D. S. Liu, Y. C. Chao, C. H. Lin, G. S. Shen, H. S. Liu
    Numerical study on the bonding tool position, tip profile and planarity angle influences on TAB/ILB interconnection reliability. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:935-943 [Journal]
  15. Dominik Kasprowicz, Witold A. Pleskacz
    Improvement of integrated circuit testing reliability by using the defect based approach. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:945-953 [Journal]
  16. Belén Calvo, Santiago Celma, Pedro A. Martínez, Maria Teresa Sanz
    Novel high performance CMOS current conveyor. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:955-961 [Journal]
  17. W. L. Pearn, Ming-Hung Shu
    Manufacturing capability control for multiple power-distribution switch processes based on modified Cpk MPPAC. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:963-975 [Journal]
  18. Takeshi Yanagisawa, Takeshi Kojima
    Degradation of InGaN blue light-emitting diodes under continuous and low-speed pulse operations. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:977-980 [Journal]
  19. B. Alpat, R. Battiston, M. Bizzarri, D. Caraffini, E. Fiori, A. Papi, M. Petasecca, A. Pontetti
    The radiation sensitivity mapping of ICs using an IR pulsed laser system. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2003, v:43, n:6, pp:981-984 [Journal]
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