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Journals in DBLP

Microelectronics Reliability
2004, volume: 44, number: 8

  1. Rolf-Peter Vollertsen
    Fast wafer level reliability: methods and experiences. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1207-1208 [Journal]
  2. Andreas Martin, Rolf-Peter Vollertsen
    An introduction to fast wafer level reliability monitoring for integrated circuit mass production. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1209-1231 [Journal]
  3. Summer F. C. Tseng, Wei-Ting Kary Chien, Excimer Gong, Willings Wang, Bing-Chu Cai
    Some practical considerations for effective and efficient wafer-level reliability control. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1233-1243 [Journal]
  4. David Smeets, Josef Fazekas
    Quantifying charging damage in gate oxides of antenna structures for WLR monitoring. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1245-1250 [Journal]
  5. Werner Muth, Wolfgang Walter
    Bias temperature instability assessment of n- and p-channel MOS transistors using a polysilicon resistive heated scribe lane test structure. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1251-1262 [Journal]
  6. Barry O'Connell, Prasad Chaparala, Bhola Mehrotra
    Evaluation of performance-reliability trade-offs in a Si-Ge BiCMOS process using fast wafer level techniques. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1263-1268 [Journal]
  7. Guoqiao Tao, Andrea Scarpa, Leo van Marwijk, Kitty van Dijk, Fred G. Kuper
    Applying the fWLR concept to Stress induced leakage current in non-volatile memory processes. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1269-1273 [Journal]
  8. Mile K. Stojcev
    Reliability of Computer Systems and Networks: Fault Tolerance, Analysis and Design; Martin L. Shooman. John Wiley and Sons Inc., New York; 2002. Hardcover, pp 528, plus XXII. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1275-1276 [Journal]
  9. Mile K. Stojcev
    Power Distribution Networks in High Speed Integrated Circuits; Andrey Mezhiba, Eby Friedman. Kluwer Academic Publishers, Boston; 2004. Hardcover, 280pp, plus XXIII, ISBN 1-4020-7534-0. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1277-1278 [Journal]
  10. Mile K. Stojcev
    Digital design and computer architecture; Hassan A. Farhat. CRC Press, Boca Raton: 2004. Hardcover, 487pp, plus XXII. ISBN 0-8493-1191-8. [Citation Graph (0, 0)][DBLP]
    Microelectronics Reliability, 2004, v:44, n:8, pp:1279-1280 [Journal]
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